Inventor · disambiguated record
Yoshiaki Hasegawa
Also filed as: HASEGAWA YOSHIAKI
65 granted patents·21 pending applications·748 citations·filing 1997–2022
99Inventor score
Files withMATSUSHITA ELECTRIC INDUSTRIAL CO LTD27PANASONIC CORP16TOSHIBA KK8HASEGAWA YOSHIAKI5HITACHI LTD5
Top patents by PatentIndex Score
86 records- 0196US6720586B1Method of fabricating nitride semiconductor, method of fabricating nitride semiconductor device, nitride semiconductor device, semiconductor light emitting device and method of fabricating the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted Apr 13, 2004·98 cites·4 claims
- 0293US7501667B2Nitride semiconductor light-emitting devicePANASONIC CORP·Filed 2005·Granted Mar 10, 2009·16 cites·14 claims
- 0392US6614059B1Semiconductor light-emitting device with quantum wellMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted Sep 2, 2003·91 cites·5 claims
- 0490US7160748B2Method for fabricating nitride semiconductor, method for fabricating nitride semiconductor device, and nitride semiconductor deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2005·Granted Jan 9, 2007·13 cites·11 claims
- 0585US7846820B2Nitride semiconductor device and process for producing the samePANASONIC CORP·Filed 2005·Granted Dec 7, 2010·10 cites·13 claims
- 0685US7848745B2Radio access point testing method and testing apparatusHITACHI LTD·Filed 2010·Granted Dec 7, 2010·7 cites·6 claims
- 0785US6958493B2Method for fabricating semiconductor light emitting deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2005·Granted Oct 25, 2005·8 cites·2 claims
- 0883US6030849AMethods of manufacturing semiconductor, semiconductor device and semiconductor substrateMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1998·Granted Feb 29, 2000·66 cites·23 claims
- 0982US6586774B2Method for fabricating nitride semiconductor, method for fabricating nitride semiconductor device, and nitride semiconductor deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Jul 1, 2003·21 cites·6 claims
- 1081US9209743B2Fault detection apparatus and fault detection methodHASEGAWA YOSHIAKI·Filed 2012·Granted Dec 8, 2015·6 cites·27 claims
- 1181US7366508B2Radio access point testing method and testing apparatusHITACHI COMM TECH LTD·Filed 2004·Granted Apr 29, 2008·28 cites·8 claims
- 1281US6911351B2Method of fabricating nitride semiconductor, method of fabricating nitride semiconductor device, nitride semiconductor device, semiconductor light emitting device and method of fabricating the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2003·Granted Jun 28, 2005·22 cites·87 claims
- 1380US7995674B2Digital predistortion transmitterHITACHI LTD·Filed 2010·Granted Aug 9, 2011·7 cites·3 claims
- 1480US7353020B2Radio access point testing apparatus and method of testing radio access pointHITACHI COMM TECH LTD·Filed 2006·Granted Apr 1, 2008·13 cites·11 claims
- 1580US6806109B2Method of fabricating nitride based semiconductor substrate and method of fabricating nitride based semiconductor deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2003·Granted Oct 19, 2004·22 cites·22 claims
- 1678US7704860B2Nitride-based semiconductor device and method for fabricating the samePANASONIC CORP·Filed 2005·Granted Apr 27, 2010·6 cites·9 claims
- 1777US6884648B2Method for fabricating semiconductor light emitting deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2003·Granted Apr 26, 2005·12 cites·20 claims
- 1876US7005680B2Semiconductor light-emitting device including a divided electrode having a plurality of spaced apart conductive membersMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2003·Granted Feb 28, 2006·11 cites·14 claims
- 1975US6709881B2Method for manufacturing semiconductor and method for manufacturing semiconductor deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Mar 23, 2004·15 cites·1 claims
- 2074US9048781B2Abnormality diagnosis device, method therefor, and computer-readable mediumSATO MAKOTO·Filed 2012·Granted Jun 2, 2015·2 cites·9 claims
- 2173US9257849B2Electrical quantity adjusting apparatus, electrical quantity adjusting method, electrical quantity adjusting program and power supply systemIINO YUTAKA·Filed 2012·Granted Feb 9, 2016·5 cites·15 claims
- 2272US7901958B2Fabrication method of semiconductor integrated circuit deviceRENESAS ELECTRONICS CORP·Filed 2010·Granted Mar 8, 2011·2 cites·18 claims
- 2372US6611005B2Method for producing semiconductor and semiconductor laser deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Aug 26, 2003·17 cites·2 claims
- 2471US8306085B2Nitride compound semiconductor element and method for manufacturing sameHASEGAWA YOSHIAKI·Filed 2011·Granted Nov 6, 2012·2 cites·8 claims
- 2571US7221690B2Semiconductor laser and process for manufacturing the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2003·Granted May 22, 2007·8 cites·8 claims
- 2671US6562129B2Formation method for semiconductor layerMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted May 13, 2003·11 cites·6 claims
- 2771US6137493AMultidimensional data management method, multidimensional data management apparatus and medium onto which is stored a multidimensional data management programTOSHIBA KK·Filed 1997·Granted Oct 24, 2000·61 cites·44 claims
- 2870US6662204B2Thread control system and method in a computer systemTOSHIBA KK·Filed 2002·Granted Dec 9, 2003·15 cites·5 claims
- 2969US6653662B2Semiconductor light-emitting device, method for fabricating the same, and method for driving the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Nov 25, 2003·8 cites·7 claims
- 3068US8039283B2Nitride compound semiconductor element and method for manufacturing samePANASONIC CORP·Filed 2006·Granted Oct 18, 2011·2 cites·6 claims
- 3167US8222670B2Semiconductor light emitting element and method for manufacturing sameANZUE NAOMI·Filed 2011·Granted Jul 17, 2012·1 cites·4 claims
- 3267US8093685B2Nitride compound semiconductor elementANZUE NAOMI·Filed 2005·Granted Jan 10, 2012·2 cites·10 claims
- 3367US8030677B2Semiconductor light emitting element and method for manufacturing samePANASONIC CORP·Filed 2007·Granted Oct 4, 2011·2 cites·1 claims
- 3465US8231726B2Semiconductor light emitting element, group III nitride semiconductor substrate and method for manufacturing such group III nitride semiconductor substrateMINEMOTO HISASHI·Filed 2007·Granted Jul 31, 2012·3 cites·26 claims
- 3565US6940100B2Group III-V nitride semiconductor light-emitting device which allows for efficient injection of electrons into an active layerMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2003·Granted Sep 6, 2005·11 cites·9 claims
- 3665US6466597B1Semiconductor laser deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1999·Granted Oct 15, 2002·27 cites·21 claims
- 3763US8018134B2Light source, optical pickup, and electronic apparatusPANASONIC CORP·Filed 2008·Granted Sep 13, 2011·1 cites·20 claims
- 3862US7907908B2Radio access point testing apparatus and method of testing radio access pointHITACHI LTD·Filed 2008·Granted Mar 15, 2011·3 cites·9 claims
- 3962US7864881B2Digital predistortion transmitterHITACHI LTD·Filed 2007·Granted Jan 4, 2011·4 cites·5 claims
- 4062US6072762AOptical disk recording/reproducing method and apparatus for preventing wave length shift during recording and reproducing operationsMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1999·Granted Jun 6, 2000·15 cites·6 claims
- 4160US7396697B2Semiconductor light-emitting device and method for manufacturing the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Granted Jul 8, 2008·4 cites·7 claims
- 4259US6977186B2Method for manufacturing semiconductor laser optical deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2003·Granted Dec 20, 2005·5 cites·2 claims
- 4357US12126070B2Antenna module and communication device equipped with the sameMURATA MANUFACTURING CO·Filed 2022·Granted Oct 22, 2024·0 cites·16 claims
- 4457US7816696B2Nitride semiconductor device and method for manufacturing samePANASONIC CORP·Filed 2006·Granted Oct 19, 2010·1 cites·13 claims
- 4557US6434591B1Thread control system and method in a computer systemTOSHIBA KK·Filed 1999·Granted Aug 13, 2002·30 cites·9 claims
- 4656US7852891B2Nitride semiconductor light-emitting devicePANASONIC CORP·Filed 2008·Granted Dec 14, 2010·0 cites·10 claims
- 4753US8130805B2Semiconductor laser apparatusMURASAWA SATOSHI·Filed 2010·Granted Mar 6, 2012·1 cites·11 claims
- 4853US7622749B2Semiconductor light-emitting element and method for fabricating the samePANASONIC CORP·Filed 2008·Granted Nov 24, 2009·0 cites·9 claims
- 4953US7056756B2Nitride semiconductor laser device and fabricating method thereofMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2003·Granted Jun 6, 2006·3 cites·4 claims
- 5053US2013082724A1Pv panel diagnosis device, diagnosis method and diagnosis programTOSHIBA KK·Filed 2012·Application pending·0 cites
Showing the top 50 of 86 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →