Inventor · disambiguated record
Yoshihiro Hashimoto
Also filed as: ARAKI HIROSHI · HASHIMOTO YOSHIHIRO
79 granted patents·16 pending applications·1,256 citations·filing 1972–2025
99Inventor score
Files withADVANTEST CORP28SHARP KK7HASHIMOTO YOSHIHIRO6SUMITOMO OSAKA CEMENT CO LTD6NITTO CHEMICAL INDUSTRY CO LTD5
Top patents by PatentIndex Score
95 records- 0197US4866888AWire incrusted with abrasive grainSUMITOMO ELECTRIC INDUSTRIES·Filed 1987·Granted Sep 19, 1989·80 cites·10 claims
- 0294US7132844B2Testing device and testing method for testing an electronic deviceADVANTEST CORP·Filed 2005·Granted Nov 7, 2006·28 cites·16 claims
- 0394US6975978B1Method and apparatus for fault simulation of semiconductor integrated circuitADVANTEST CORP·Filed 2000·Granted Dec 13, 2005·64 cites·9 claims
- 0494US5784132ADisplay deviceSONY CORP·Filed 1997·Granted Jul 21, 1998·161 cites·15 claims
- 0593US5708485AActive matrix display deviceSONY CORP·Filed 1996·Granted Jan 13, 1998·169 cites·26 claims
- 0690US6327006B1TFT-LCD having shielding layers on TFT-substrateSONY CORP·Filed 1999·Granted Dec 4, 2001·114 cites·11 claims
- 0789US5508181AProcess for producing alpha-hydroxy acid or alpha-hydroxyamide by microorganismsNITTO CHEMICAL INDUSTRY CO LTD·Filed 1995·Granted Apr 16, 1996·50 cites·4 claims
- 0888US7576555B2Current measuring apparatus, test apparatus, current measuring method and test methodADVANTEST CORP·Filed 2008·Granted Aug 18, 2009·15 cites·17 claims
- 0984US7751724B2Optical modulatorSUMITOMO OSAKA CEMENT CO LTD·Filed 2007·Granted Jul 6, 2010·10 cites·12 claims
- 1084US6313657B1IC testing apparatus and testing method using sameADVANTEST CORP·Filed 1999·Granted Nov 6, 2001·51 cites·13 claims
- 1182US6593765B1Testing apparatus and testing method for semiconductor integrated circuitADVANTEST CORP·Filed 2000·Granted Jul 15, 2003·26 cites·16 claims
- 1280US7825666B2Test apparatus and measurement apparatus for measuring an electric current consumed by a device under testADVANTEST CORP·Filed 2008·Granted Nov 2, 2010·8 cites·14 claims
- 1380US2025388080A1Input deviceALPS ALPINE CO LTD·Filed 2025·Application pending·0 cites
- 1479US6391667B1Power supply unit, semiconductor device testing apparatus and semiconductor device testing methodADVANTEST CORP·Filed 2000·Granted May 21, 2002·22 cites·20 claims
- 1578US7330024B2Power supply device, test apparatus, and power supply voltage stabilizing deviceADVANTEST CORP·Filed 2005·Granted Feb 12, 2008·9 cites·14 claims
- 1677US6828815B2Method and apparatus for defect analysis of semiconductor integrated circuitADVANTEST CORP·Filed 2004·Granted Dec 7, 2004·17 cites·3 claims
- 1777US6255842B1Applied-voltage-based current measuring method and deviceADVANTEST CORP·Filed 1997·Granted Jul 3, 2001·41 cites·9 claims
- 1875US7170602B2Particle monitoring device and processing apparatus including sameTOKYO ELECTRON LTD·Filed 2005·Granted Jan 30, 2007·4 cites·8 claims
- 1974US7899338B2Method and device for controlling bias of optical modulatorSUMITOMO OSAKA CEMENT CO LTD·Filed 2004·Granted Mar 1, 2011·15 cites·10 claims
- 2074US7005867B2Power supply circuit and testing deviceADVANTEST CORP·Filed 2003·Granted Feb 28, 2006·20 cites·18 claims
- 2173US7138819B2Differential voltage measuring apparatus and semiconductor testing apparatusADVANTEST CORP·Filed 2003·Granted Nov 21, 2006·16 cites·9 claims
- 2273US6801049B2Method and apparatus for defect analysis of semiconductor integrated circuitADVANTEST CORP·Filed 2001·Granted Oct 5, 2004·14 cites·21 claims
- 2372US6404220B1IC testing method and IC testing device using the sameADVANTEST CORP·Filed 1997·Granted Jun 11, 2002·33 cites·5 claims
- 2471US9939127B2Illumination deviceSHARP KK·Filed 2013·Granted Apr 10, 2018·2 cites·20 claims
- 2571US9217552B2Illumination deviceSHARP KK·Filed 2013·Granted Dec 22, 2015·2 cites·15 claims
- 2670US8164351B2Test apparatusHASHIMOTO YOSHIHIRO·Filed 2009·Granted Apr 24, 2012·6 cites·4 claims
- 2769US6255839B1Voltage applied type current measuring circuit in an IC testing apparatusADVANTEST CORP·Filed 1998·Granted Jul 3, 2001·29 cites·9 claims
- 2868US7697846B2Method for changing frequency and base station in radio optical fusion communication systemNAT INST INF & COMM TECH·Filed 2005·Granted Apr 13, 2010·4 cites·10 claims
- 2966US9122097B2Backlight system and LCD device using the sameUCHIDA TATSUO·Filed 2010·Granted Sep 1, 2015·2 cites·13 claims
- 3066US7035488B2Optical waveguide elementSUMITOMO OSAKA CEMENT CO LTD·Filed 2005·Granted Apr 25, 2006·2 cites·13 claims
- 3165US6323668B1IC testing deviceADVANTEST CORP·Filed 1997·Granted Nov 27, 2001·26 cites·18 claims
- 3263US7869668B2Method for generating carrier residual signal and its deviceSUMITOMO OSAKA CEMENT CO LTD·Filed 2004·Granted Jan 11, 2011·7 cites·10 claims
- 3362US10093385B2Straddle-type vehicleHONDA MOTOR CO LTD·Filed 2016·Granted Oct 9, 2018·1 cites·18 claims
- 3462US5594359AVoltage generating circuit for IC testADVANTEST CORP·Filed 1995·Granted Jan 14, 1997·24 cites·7 claims
- 3562US4001384AProcess for recovery of oxides of sulfur from combustion waste gasASAHI GLASS CO LTD·Filed 1973·Granted Jan 4, 1977·21 cites·8 claims
- 3661US6492831B2Current measuring method and current measuring apparatusADVANTEST CORP·Filed 2001·Granted Dec 10, 2002·9 cites·19 claims
- 3760US11810738B2Input device employing a flex sensor and a switch outputting first and second signalsALPS ALPINE CO LTD·Filed 2021·Granted Nov 7, 2023·0 cites·15 claims
- 3860US7362104B2Current measurement device and test deviceADVANTEST CORP·Filed 2005·Granted Apr 22, 2008·3 cites·8 claims
- 3960US6522792B1Light modulator of waveguide typeSUMITOMO OSAKA CEMENT CO LTD·Filed 1999·Granted Feb 18, 2003·28 cites·9 claims
- 4060US4526627AMethod and apparatus for direct heat treatment of medium- to high-carbon steel rodsSUMITOMO ELECTRIC INDUSTRIES·Filed 1984·Granted Jul 2, 1985·9 cites·29 claims
- 4157US9023565B2Developer, developer container, image formation unit, and image formation apparatusOKI DATA KK·Filed 2012·Granted May 5, 2015·0 cites·6 claims
- 4257US2007148725A1Soil microorganism-housing biosensors and their usesHASHIMOTO YOSHIHIRO·Filed 2004·Application pending·0 cites
- 4356US9989870B2Image formation apparatus, transparent developer and developer cartridgeOKI DATA KK·Filed 2014·Granted Jun 5, 2018·0 cites·8 claims
- 4456US5707836AProduction of alkylene or phenylenediamine disuccinic acid from fumaric acid and a diamine using lyase from microbesNITTO CHEMICAL INDUSTRY CO LTD·Filed 1996·Granted Jan 13, 1998·6 cites·12 claims
- 4556US2024377911A1Input operation deviceALPS ALPINE CO LTD·Filed 2024·Application pending·0 cites
- 4655US11780026B2Welding operation monitoring system and welding operation monitoring methodNIPPON STEEL CORP·Filed 2018·Granted Oct 10, 2023·0 cites·20 claims
- 4755US8054404B2Surface light source deviceSHARP KK·Filed 2009·Granted Nov 8, 2011·1 cites·13 claims
- 4855US2024251266A1Communication monitoring system in control networkNAGOYA INST TECH·Filed 2022·Application pending·0 cites
- 4954US6781364B2Electron device testing apparatus having high current and low current testing featuresADVANTEST CORP·Filed 2003·Granted Aug 24, 2004·6 cites·2 claims
- 5053US11520276B2Charging device, image forming unit, image forming apparatus, and method of manufacturing cleaning memberOKI ELECTRIC IND CO LTD·Filed 2021·Granted Dec 6, 2022·0 cites·13 claims
Showing the top 50 of 95 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →