Inventor · disambiguated record
Yoshio Ishihara
Also filed as: ISHIHARA YOSHIO
25 granted patents·6 pending applications·1,016 citations·filing 1992–2010
97Inventor score
Files withNIPPON OXYGEN CO LTD14TAIYO NIPPON SANSO CORP5MITSUBISHI MATERIAL SILICON3HORIBA LTD2KURARAY CO2
Top patents by PatentIndex Score
31 records- 0198US6343239B1Transportation method for substrate wafers and transportation apparatusNIPPON OXYGEN CO LTD·Filed 1997·Granted Jan 29, 2002·360 cites·6 claims
- 0296US5953591AProcess for laser detection of gas and contaminants in a wafer transport gas tunnelNIPPON OXYGEN CO LTD·Filed 1996·Granted Sep 14, 1999·217 cites·13 claims
- 0393US7258725B2Gas supplying method and systemTAIYO NIPPON SANSO CORP·Filed 2002·Granted Aug 21, 2007·67 cites·5 claims
- 0489US8657922B2Pressure swing adsorption-type gas separation method and separation apparatusYAMAWAKI MASAYA·Filed 2010·Granted Feb 25, 2014·44 cites·6 claims
- 0585US6217633B1Method and apparatus for recovering rare gasNIPPON OXYGEN CO LTD·Filed 1998·Granted Apr 17, 2001·51 cites·8 claims
- 0682US7033843B2Semiconductor manufacturing method and semiconductor manufacturing apparatusMITSUBISHI MATERIAL SILICON·Filed 2003·Granted Apr 25, 2006·22 cites·8 claims
- 0779US6605134B2Method and apparatus for collecting rare gasNIPPON OXYGEN CO LTD·Filed 2001·Granted Aug 12, 2003·29 cites·6 claims
- 0875US7594955B2Process for recovering rare gases using gas-recovering containerTAIYO NIPPON SANSO CORP·Filed 2005·Granted Sep 29, 2009·6 cites·3 claims
- 0971US6040915AAnalysis method for gases and apparatus thereforNIPPON OXYGEN CO LTD·Filed 1998·Granted Mar 21, 2000·40 cites·22 claims
- 1071US5821537AInfrared spectroscopic analysis method for gases and device employing the method thereinNIPPON OXYGEN CO LTD·Filed 1997·Granted Oct 13, 1998·33 cites·12 claims
- 1166US5766321AApparatus for reducing dissolved oxygenNIPPON OXYGEN CO LTD·Filed 1994·Granted Jun 16, 1998·31 cites·7 claims
- 1261US6869579B2Process for treating exhaust gasNIPPON OXYGEN CO LTD·Filed 2001·Granted Mar 22, 2005·4 cites·2 claims
- 1361US5703365AInfrared spectroscopic analysis method for gases and device employing the method thereinNIPPON OXYGEN CO LTD·Filed 1995·Granted Dec 30, 1997·23 cites·19 claims
- 1460US7258909B2Leather-like sheet for ballsKURARAY CO·Filed 2004·Granted Aug 21, 2007·3 cites·21 claims
- 1559US7976806B2Granular material comprising porous particles containing calcium and/or magnesiumUBE MAT IND LTD·Filed 2006·Granted Jul 12, 2011·1 cites·20 claims
- 1658US6240610B1Wafer and transport systemNIPPON OXYGEN CO LTD·Filed 1999·Granted Jun 5, 2001·18 cites·7 claims
- 1756US6519039B1Gas spectrochemical analyzer, and spectrochemical analyzing methodNIPPON OXYGEN CO LTD·Filed 1999·Granted Feb 11, 2003·24 cites·8 claims
- 1855US6887721B2Method of purging CVD apparatus and method for judging maintenance of times of semiconductor production apparatusesTAIYO NIPPON SANSO CORP·Filed 2001·Granted May 3, 2005·2 cites·6 claims
- 1951US6776805B2Semiconductor manufacturing apparatus having a moisture measuring deviceMITSUBISHI MATERIAL SILICON·Filed 2001·Granted Aug 17, 2004·2 cites·16 claims
- 2047US2009246524A1Porous calcium oxide particulate and porous calcium hydroxide particulateUNIV TOHOKU NAT UNIV CORP·Filed 2007·Application pending·0 cites
- 2146US2005058794A1Sheet material, gas filling type ball and gloveKURARAY CO·Filed 2004·Application pending·0 cites
- 2244US5444379AElectric conductivity measuring cellHORIBA LTD·Filed 1992·Granted Aug 22, 1995·12 cites·26 claims
- 2344US2009032749A1Regulating Valve and Fuel Cell SystemISHIHARA YOSHIO·Filed 2007·Application pending·0 cites
- 2442US6794204B2Semiconductor manufacturing method and semiconductor manufacturing apparatusMITSUBISHI MATERIAL SILICON·Filed 2002·Granted Sep 21, 2004·0 cites·3 claims
- 2542US6312328B1System and method for producing and supplying highly clean dry airNIPPON OXYGEN CO LTD·Filed 1999·Granted Nov 6, 2001·12 cites·15 claims
- 2642US5759214ANitrogen gas supply systemNIPPON OXYGEN CO LTD·Filed 1996·Granted Jun 2, 1998·9 cites·3 claims
- 2738US2009246089A1Exhaust Gas-Processing ApparatusTAIYO NIPPON SANSO CORP·Filed 2006·Application pending·0 cites
- 2837US2007160512A1Method for treating exhaust gas and apparatus for treating exhaust gasTAIYO NIPPON SANSO CORP·Filed 2005·Application pending·0 cites
- 2933US6375911B1Method and device for treating exhaust gasNIPPON OXYGEN CO LTD·Filed 1998·Granted Apr 23, 2002·4 cites·5 claims
- 3033US2007154372A1Exhaust gas treatment agent, exhaust gas treatment method and exhaust gas treatment deviceHASEGAWA HIDEHARU·Filed 2005·Application pending·0 cites
- 3129US5414361AMethod of measuring very small quantity of impurity in gasHORIBA LTD·Filed 1992·Granted May 9, 1995·2 cites·6 claims
Join the waitlist — get patent alerts
Get an alert when Yoshio Ishihara files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →