Inventor · disambiguated record
Yoichiro Iwa
Also filed as: IWA YOICHIRO
13 granted patents·2 pending applications·148 citations·filing 1998–2018
89Inventor score
Top patents by PatentIndex Score
15 records- 0188US6104481ASurface inspection apparatusTOPCON CORP·Filed 1998·Granted Aug 15, 2000·113 cites·12 claims
- 0268US7524062B2Ophthalmologic apparatusTOPCON CORP·Filed 2007·Granted Apr 28, 2009·7 cites·4 claims
- 0367US7477373B2Surface inspection method and surface inspection deviceTOPCON CORP·Filed 2007·Granted Jan 13, 2009·2 cites·8 claims
- 0467US7417732B2Particle monitoring apparatus and vacuum processing apparatusTOPCON CORP·Filed 2005·Granted Aug 26, 2008·2 cites·10 claims
- 0565US6771364B2Surface inspecting apparatusTOPCON CORP·Filed 2002·Granted Aug 3, 2004·6 cites·11 claims
- 0664US7533990B2Ophthalmologic apparatusTOPCON CORP·Filed 2007·Granted May 19, 2009·4 cites·17 claims
- 0760US7348585B2Surface inspection apparatusTOPCON CORP·Filed 2005·Granted Mar 25, 2008·4 cites·18 claims
- 0859US7245366B2Surface inspection method and surface inspection apparatusTOPCON CORP·Filed 2004·Granted Jul 17, 2007·3 cites·12 claims
- 0954US7154597B2Method for inspecting surface and apparatus for inspecting itTOPCON CORP·Filed 2004·Granted Dec 26, 2006·5 cites·9 claims
- 1051US7227649B2Surface inspection apparatusTOPCON CORP·Filed 2005·Granted Jun 5, 2007·2 cites·12 claims
- 1147US7566129B2Ophthalmologic apparatusTOPCON CORP·Filed 2007·Granted Jul 28, 2009·0 cites·4 claims
- 1244US2004169853A1Surface inspection apparatusFiled 2004·Application pending·0 cites
- 1340US10473579B2Apparatus for inspecting material property of plurality of measurement objectsSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Nov 12, 2019·0 cites·14 claims
- 1439US2004095572A1Laser light source device and surface inspection apparatus using itTOPCON CORP·Filed 2003·Application pending·0 cites
- 1534US7394532B2Surface inspection method and apparatusTOPCON CORP·Filed 2003·Granted Jul 1, 2008·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →