Inventor · disambiguated record
Yosuke Kajiwara
Also filed as: KAJIWARA YOSUKE
41 granted patents·19 pending applications·46 citations·filing 2008–2025
95Inventor score
Top patents by PatentIndex Score
60 records- 0193US11563114B2Semiconductor device and method of manufacturing the sameTOSHIBA KK·Filed 2021·Granted Jan 24, 2023·3 cites·23 claims
- 0291US11476336B2Semiconductor deviceTOSHIBA KK·Filed 2020·Granted Oct 18, 2022·3 cites·18 claims
- 0389US8604571B2Thermoelectric conversion deviceUCHIDA KENICHI·Filed 2009·Granted Dec 10, 2013·12 cites·8 claims
- 0487US11018248B2Semiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 2019·Granted May 25, 2021·3 cites·19 claims
- 0586US11189718B2Semiconductor device with suppressed self-turn-onTOSHIBA KK·Filed 2020·Granted Nov 30, 2021·2 cites·19 claims
- 0683US2025374586A1Semiconductor deviceTOSHIBA KK·Filed 2025·Application pending·0 cites
- 0778US11088269B2Semiconductor deviceTOSHIBA KK·Filed 2020·Granted Aug 10, 2021·1 cites·16 claims
- 0875US11967641B2Semiconductor device including different nitride regions improving characteristics of the semiconductor deviceTOSHIBA KK·Filed 2023·Granted Apr 23, 2024·0 cites·20 claims
- 0975US11139393B2Semiconductor device including different nitride regions and method for manufacturing sameTOSHIBA KK·Filed 2019·Granted Oct 5, 2021·1 cites·20 claims
- 1074US10373833B2Semiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 2016·Granted Aug 6, 2019·2 cites·24 claims
- 1174US2024312780A1Semiconductor device, inspection apparatus of semiconductor device, and method for inspecting semiconductor deviceTOSHIBA KK·Filed 2024·Application pending·0 cites
- 1273US10109715B2Semiconductor deviceTOSHIBA KK·Filed 2016·Granted Oct 23, 2018·2 cites·13 claims
- 1373US9484421B2Semiconductor deviceTOSHIBA KK·Filed 2015·Granted Nov 1, 2016·2 cites·9 claims
- 1472US11757028B2Semiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 2021·Granted Sep 12, 2023·0 cites·19 claims
- 1570US11515411B2Silicon rich nitride layer between a plurality of semiconductor layersTOSHIBA KK·Filed 2021·Granted Nov 29, 2022·0 cites·26 claims
- 1670US10910490B2Semiconductor deviceTOSHIBA KK·Filed 2019·Granted Feb 2, 2021·1 cites·20 claims
- 1770US10243058B2Semiconductor device and electrical deviceTOSHIBA KK·Filed 2017·Granted Mar 26, 2019·1 cites·21 claims
- 1869US11677020B2Semiconductor device including different nitride regions and method for manufacturing sameTOSHIBA KK·Filed 2021·Granted Jun 13, 2023·0 cites·15 claims
- 1969US8203191B2Spin current thermal conversion device and thermoelectric conversion deviceUCHIDA KENICHI·Filed 2008·Granted Jun 19, 2012·8 cites·6 claims
- 2067USRE49962ESemiconductor deviceTOSHIBA KK·Filed 2022·Granted May 7, 2024·0 cites·26 claims
- 2167US2023006058A1Semiconductor deviceTOSHIBA KK·Filed 2022·Application pending·0 cites
- 2266US8254163B2Spintronic device and information transmitting methodKAJIWARA YOSUKE·Filed 2009·Granted Aug 28, 2012·5 cites·6 claims
- 2364USRE50471ESemiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 2022·Granted Jun 24, 2025·0 cites·20 claims
- 2460US2025159920A1Semiconductor deviceTOSHIBA KK·Filed 2024·Application pending·0 cites
- 2560US2025203909A1Semiconductor deviceTOSHIBA KK·Filed 2024·Application pending·0 cites
- 2660US2025169148A1Semiconductor deviceTOSHIBA KK·Filed 2024·Application pending·0 cites
- 2760US2021327711A1Semiconductor device, inspection apparatus of semiconductor device, and method for inspecting semiconductor deviceTOSHIBA KK·Filed 2021·Application pending·0 cites
- 2859US2024395919A1Semiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 2024·Application pending·0 cites
- 2959US2025056826A1Semiconductor deviceTOSHIBA KK·Filed 2024·Application pending·0 cites
- 3057US2024274703A1Semiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 2023·Application pending·0 cites
- 3156US2024313100A1Semiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 2023·Application pending·0 cites
- 3256US2024047534A1Semiconductor deviceTOSHIBA KK·Filed 2023·Application pending·0 cites
- 3355US10916646B2Semiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 2019·Granted Feb 9, 2021·0 cites·18 claims
- 3455US10714608B2Semiconductor deviceTOSHIBA KK·Filed 2019·Granted Jul 14, 2020·0 cites·13 claims
- 3554US2023246079A1Semiconductor deviceTOSHIBA KK·Filed 2022·Application pending·0 cites
- 3653US2023253487A1Semiconductor deviceTOSHIBA KK·Filed 2022·Application pending·0 cites
- 3752US12087823B2Semiconductor deviceTOSHIBA KK·Filed 2022·Granted Sep 10, 2024·0 cites·20 claims
- 3852US2025331217A1Semiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 2025·Application pending·0 cites
- 3951US12396228B2Semiconductor deviceTOSHIBA KK·Filed 2022·Granted Aug 19, 2025·0 cites·19 claims
- 4051US12349386B2Semiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 2021·Granted Jul 1, 2025·0 cites·18 claims
- 4151US11362653B2Semiconductor deviceTOSHIBA KK·Filed 2020·Granted Jun 14, 2022·0 cites·19 claims
- 4250US12513934B2Semiconductor deviceTOSHIBA KK·Filed 2022·Granted Dec 30, 2025·0 cites·17 claims
- 4350US12477769B2Semiconductor device in which current collapse and leakage current between source and drain regions are suppressedTOSHIBA KK·Filed 2022·Granted Nov 18, 2025·0 cites·21 claims
- 4450US12237409B2Semiconductor deviceTOSHIBA KK·Filed 2022·Granted Feb 25, 2025·0 cites·20 claims
- 4550US12218232B2Semiconductor device including compound and nitride membersTOSHIBA KK·Filed 2022·Granted Feb 4, 2025·0 cites·20 claims
- 4650US12154966B2Semiconductor device that includes a conductive member and an electrode and method for manufacturing the sameTOSHIBA KK·Filed 2021·Granted Nov 26, 2024·0 cites·18 claims
- 4750US2022130986A1Semiconductor deviceTOSHIBA KK·Filed 2021·Application pending·0 cites
- 4850US2025261420A1Semiconductor device and manufacturing method for the sameTOSHIBA KK·Filed 2025·Application pending·0 cites
- 4949US12080765B2Semiconductor deviceTOSHIBA KK·Filed 2022·Granted Sep 3, 2024·0 cites·23 claims
- 5049US11276778B2Semiconductor deviceTOSHIBA KK·Filed 2020·Granted Mar 15, 2022·0 cites·20 claims
Showing the top 50 of 60 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →