Inventor · disambiguated record
Yoshio Kameda
Also filed as: KAMEDA YOSHIO
15 granted patents·21 pending applications·32 citations·filing 1995–2024
88Inventor score
Top patents by PatentIndex Score
36 records- 0178US8330254B2Semiconductor deviceFURUMIYA MASAYUKI·Filed 2009·Granted Dec 11, 2012·6 cites·3 claims
- 0276US11435705B2Control objective integration system, control objective integration method and control objective integration programNEC CORP·Filed 2016·Granted Sep 6, 2022·2 cites·9 claims
- 0364US8399960B2Semiconductor deviceNAKAGAWA YOSHIHIRO·Filed 2009·Granted Mar 19, 2013·3 cites·4 claims
- 0464US2025209694A1Information processing apparatus, visualization method, and non-transitory computer-readable mediumNEC CORP·Filed 2024·Application pending·0 cites
- 0563US10776945B2Dimension measurement device, dimension measurement system, and dimension measurement methodNEC CORP·Filed 2016·Granted Sep 15, 2020·1 cites·11 claims
- 0663US10048658B2Information processing device, predictive control method, and recording mediumNEC CORP·Filed 2014·Granted Aug 14, 2018·1 cites·18 claims
- 0759US2025200304A1Information processing device, information processing method, and recording mediumNEC CORP·Filed 2024·Application pending·0 cites
- 0859US2025208860A1Information processing device, information processing method, and recording mediumNEC CORP·Filed 2024·Application pending·0 cites
- 0958US8862934B2Redundant computing system and redundant computing methodKAMEDA YOSHIO·Filed 2010·Granted Oct 14, 2014·1 cites·18 claims
- 1058US2025190715A1Information processing apparatus, information processing method, and recording mediumNEC CORP·Filed 2024·Application pending·0 cites
- 1156US2024028912A1Predictively robust model trainingNEC CORP·Filed 2022·Application pending·0 cites
- 1254US5598105AElementary cell for constructing asynchronous superconducting logic circuitsAGENCY IND SCIENCE TECHN·Filed 1995·Granted Jan 28, 1997·15 cites·12 claims
- 1352US2022343212A1Forward compatible model trainingNEC CORP·Filed 2021·Application pending·0 cites
- 1452US2022292345A1Distributionally robust model trainingNEC CORP·Filed 2021·Application pending·0 cites
- 1551US2024119357A1Analysis device, analysis method, and non-transitory computer-readable medium having program stored thereonNEC CORP·Filed 2021·Application pending·0 cites
- 1649US8513970B2Semiconductor device and method of testing the sameKAMEDA YOSHIO·Filed 2009·Granted Aug 20, 2013·1 cites·18 claims
- 1749US2023206616A1Weakly supervised object localization method and system for implementing the sameNEC CORP·Filed 2020·Application pending·0 cites
- 1849US2025190705A1Information processing device, information processing method, and recording mediumNEC CORP·Filed 2024·Application pending·0 cites
- 1946US2011006443A1Semiconductor deviceNEC CORP·Filed 2009·Application pending·0 cites
- 2045US11443219B2Model estimation system, method, and programNEC CORP·Filed 2018·Granted Sep 13, 2022·0 cites·6 claims
- 2141US11400954B2Vehicle control system, vehicle control method, and program recording mediumNEC CORP·Filed 2017·Granted Aug 2, 2022·0 cites·7 claims
- 2241US8536890B2Semiconductor inspecting device and semiconductor inspecting methodKAMEDA YOSHIO·Filed 2009·Granted Sep 17, 2013·0 cites·21 claims
- 2341US2019385082A1Information processing device, information processing method, and program recording mediumNEC CORP·Filed 2018·Application pending·0 cites
- 2440US11579574B2Control customization system, control customization method, and control customization programNEC CORP·Filed 2017·Granted Feb 14, 2023·0 cites·12 claims
- 2540US8570056B2Semiconductor inspection apparatus, semiconductor wafer positioning method, and semiconductor wafer inspection methodKAMEDA YOSHIO·Filed 2009·Granted Oct 29, 2013·0 cites·16 claims
- 2639US6703857B2Integrated circuit of superconducting circuit blocks and method of designing the sameNEC CORP·Filed 2002·Granted Mar 9, 2004·2 cites·13 claims
- 2739US2019188344A1Linear parameter varying model estimation system, method, and programNEC CORP·Filed 2017·Application pending·0 cites
- 2839US2021390451A1Analysis device, machine learning device, analysis system, analysis method, and recording mediumNEC CORP·Filed 2019·Application pending·0 cites
- 2939US2021383157A1Analysis device, machine learning device, analysis system, analysis method, and recording mediumNEC CORP·Filed 2019·Application pending·0 cites
- 3038US2020249637A1Ensemble control system, ensemble control method, and ensemble control programNEC CORP·Filed 2017·Application pending·0 cites
- 3138US2012307650A1Multiplex systemKAMEDA YOSHIO·Filed 2010·Application pending·0 cites
- 3237US8441277B2Semiconductor testing device, semiconductor device, and testing methodNOGUCHI KOICHIRO·Filed 2008·Granted May 14, 2013·0 cites·14 claims
- 3337US2019311269A1Non-linear programming problem processing device and non-linear programming problem processing methodNEC CORP·Filed 2015·Application pending·0 cites
- 3437US2019367040A1Information processing device, travel data processing method, vehicle, and program recording mediumNEC CORP·Filed 2018·Application pending·0 cites
- 3534US2022100819A1Search device, search system, search method, and recording mediumNEC CORP·Filed 2020·Application pending·0 cites
- 3634US2018373208A1Cost function design system, cost function design method, and cost function design programNEC CORP·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →