Inventor · disambiguated record
Yongha Kim
Also filed as: KIM YONGHA
12 granted patents·4 pending applications·28 citations·filing 2016–2025
85Inventor score
Files withSAMSUNG ELECTRONICS CO LTD7NOVA LTD5HYUNDAI AUTRON CO LTD2LG CHEMICAL LTD1NOVA MEASURING INSTR LTD1
Top patents by PatentIndex Score
16 records- 0193US11763181B2Metrology and process control for semiconductor manufacturingNOVA LTD·Filed 2021·Granted Sep 19, 2023·3 cites·20 claims
- 0292US10866616B2Electronic device including cover glass and method for processing the cover glassSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Dec 15, 2020·21 cites·9 claims
- 0382US10435390B2Heterocyclic compound and organic light emitting device including sameLG CHEMICAL LTD·Filed 2016·Granted Oct 8, 2019·2 cites·13 claims
- 0480US12236364B2Metrology and process control for semiconductor manufacturingNOVA LTD·Filed 2023·Granted Feb 25, 2025·0 cites·18 claims
- 0576US2025027767A1Detecting outliers and anomalies for ocd metrology machine learningNOVA LTD·Filed 2024·Application pending·0 cites
- 0675US11093840B2Metrology and process control for semiconductor manufacturingNOVA MEASURING INSTR LTD·Filed 2019·Granted Aug 17, 2021·1 cites·16 claims
- 0775US2025181941A1Metrology and process control for semiconductor manufacturingNOVA LTD·Filed 2025·Application pending·0 cites
- 0868US10584662B2Method of controlling water injector for preventing damage to catalyst for exhaust gas purification and engine driven by methodHYUNDAI AUTRON CO LTD·Filed 2018·Granted Mar 10, 2020·1 cites·15 claims
- 0966US2025385227A1Electronic device including thermal interface material layer and semiconductor packageSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 1062US12038271B2Detecting outliers and anomalies for OCD metrology machine learningNOVA LTD·Filed 2021·Granted Jul 16, 2024·0 cites·17 claims
- 1161US12283576B2Electronic device including thermal interface material layer and semiconductor packageSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Apr 22, 2025·0 cites·20 claims
- 1254US9932926B2Injector controlling method using opening durationHYUNDAI AUTRON CO LTD·Filed 2016·Granted Apr 3, 2018·0 cites·16 claims
- 1351US12347795B2Semiconductor package including uneven structures and electronic device including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Jul 1, 2025·0 cites·21 claims
- 1449US11923264B2Semiconductor apparatus for discharging heatSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Mar 5, 2024·0 cites·14 claims
- 1542US12038558B2Curved glass comprising anti-reflection and anti-scratch coating layer and electronic deviceSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Jul 16, 2024·0 cites·8 claims
- 1642US2018361630A1Housing including patterned-structure layer and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2018·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →