Inventor · disambiguated record
Yoshiyuki Nagano
Also filed as: NAGANO YOSHIYUKI
6 granted patents·3 pending applications·153 citations·filing 1999–2017
85Inventor score
Files withHITACHI CONSTRUCTION MACHINERY4HITACHI KENKI FINE TECH CO LTD2HITACHI CONSTRUCTION MACH CO1HITACHI KENKI FINETECH CO LTD1MURAYAMA KEN1
Top patents by PatentIndex Score
9 records- 0193US6317669B1Automatically operated shovelHITACHI CONSTRUCTION MACHINERY·Filed 2000·Granted Nov 13, 2001·83 cites·24 claims
- 0285US6732458B2Automatically operated shovel and stone crushing system comprising sameHITACHI CONSTRUCTION MACHINERY·Filed 2002·Granted May 11, 2004·33 cites·16 claims
- 0357US7333191B2Scanning probe microscope and measurement method using the sameHITACHI KENKI FINETECH CO LTD·Filed 2004·Granted Feb 19, 2008·11 cites·10 claims
- 0455US7243441B2Method and apparatus for measuring depth of holes formed on a specimenHITACHI KENKI FINE TECH CO LTD·Filed 2004·Granted Jul 17, 2007·8 cites·4 claims
- 0550US6523765B1Automatically operated shovel and stone crushing system comprising the sameHITACHI CONSTRUCTION MACHINERY·Filed 1999·Granted Feb 25, 2003·15 cites·7 claims
- 0650US2017341581A1Display device for self-propelled industrial machineHITACHI CONSTRUCTION MACH CO·Filed 2017·Application pending·0 cites
- 0747US2015138356A1Display device for self-propelled industrial machineHITACHI CONSTRUCTION MACHINERY·Filed 2013·Application pending·0 cites
- 0843US7350404B2Scanning type probe microscope and probe moving control method thereforHITACHI KENKI FINE TECH CO LTD·Filed 2004·Granted Apr 1, 2008·3 cites·4 claims
- 0933US2007180889A1Probe replacement method for scanning probe microscopeMURAYAMA KEN·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →