Inventor · disambiguated record
Yoshihiro Nagura
Also filed as: NAGURA YOSHIHIRO
5 granted patents·3 pending applications·82 citations·filing 1986–2023
80Inventor score
Files withRENESAS TECH CORP3MITSUBISHI ELECTRIC CORP2ALPS ELECTRIC CO LTD1SANDISK TECHNOLOGIES LLC1WESTERN DIGITAL TECH INC1
Top patents by PatentIndex Score
8 records- 0182US6853177B2Semiconductor device with process monitor circuit and test method thereofRENESAS TECH CORP·Filed 2002·Granted Feb 8, 2005·33 cites·17 claims
- 0271US6784686B2Semiconductor testing deviceRENESAS TECH CORP·Filed 2003·Granted Aug 31, 2004·19 cites·20 claims
- 0367US4767189ATerminal connection structure for a liquid crystal display deviceALPS ELECTRIC CO LTD·Filed 1986·Granted Aug 30, 1988·27 cites·2 claims
- 0464US10283385B2Vortex pattern wet processing tool and etching methodSANDISK TECHNOLOGIES LLC·Filed 2017·Granted May 7, 2019·1 cites·20 claims
- 0557US2025113485A1Three-dimensional memory device containing laterally undulating isolation trenches and methods of making the sameWESTERN DIGITAL TECH INC·Filed 2023·Application pending·0 cites
- 0639US6802034B2Test pattern generation circuit and method for use with self-diagnostic circuitRENESAS TECH CORP·Filed 2002·Granted Oct 5, 2004·2 cites·5 claims
- 0730US2003023913A1Testing device of semiconductor integrated circuit and test method thereforMITSUBISHI ELECTRIC CORP·Filed 2002·Application pending·0 cites
- 0829US2004260975A1Semiconductor integrated circuitMITSUBISHI ELECTRIC CORP·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →