Inventor · disambiguated record
Yoonna Oh
Also filed as: OH YOONNA
13 granted patents·2 pending applications·14 citations·filing 2010–2025
85Inventor score
Top patents by PatentIndex Score
15 records- 0189US11094390B2Semiconductor memory devices and methods of operating semiconductor memory devicesSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Aug 17, 2021·3 cites·20 claims
- 0288US11869568B2Memory device for performing smart refresh operation and memory system including the sameSK HYNIX INC·Filed 2022·Granted Jan 9, 2024·2 cites·20 claims
- 0385US10339042B2Memory device including column redundancySAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Jul 2, 2019·6 cites·20 claims
- 0480US2025316325A1Memory and memory system with both long and short sub_word lines connected to same rowSK HYNIX INC·Filed 2025·Application pending·0 cites
- 0576US11527303B2Memory devices having variable repair units therein and methods of repairing sameSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Dec 13, 2022·1 cites·19 claims
- 0670US12068022B2Integrated circuit and memory device including sampling circuitSK HYNIX INC·Filed 2023·Granted Aug 20, 2024·0 cites·19 claims
- 0769US12367945B2Memory and memory system with both long and short sub word lines connected to same rowSK HYNIX INC·Filed 2023·Granted Jul 22, 2025·0 cites·3 claims
- 0867US11791014B2Memory devices having variable repair units therein and methods of repairing sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Oct 17, 2023·0 cites·19 claims
- 0966US11508456B2Semiconductor memory device capable of increasing flexibility of a column repair operationSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Nov 22, 2022·2 cites·14 claims
- 1061US11450396B2Semiconductor memory devices and methods of operating semiconductor memory devicesSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Sep 20, 2022·0 cites·13 claims
- 1160US11823730B2Integrated circuit and memory device including sampling circuitSK HYNIX INC·Filed 2022·Granted Nov 21, 2023·0 cites·20 claims
- 1257US12136450B2Memory and operation method of memory with repairing and random pulse generating capabilitySK HYNIX INC·Filed 2022·Granted Nov 5, 2024·0 cites·8 claims
- 1345US12027193B2Memory device for performing smart refresh operation by counting received addressSK HYNIX INC·Filed 2022·Granted Jul 2, 2024·0 cites·19 claims
- 1436US2013311831A1Virtual fail address generation system, redundancy analysis simulation system, and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2013·Application pending·0 cites
- 1535US8526707B2Method of inspecting a maskOH YOONNA·Filed 2010·Granted Sep 3, 2013·0 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →