Inventor · disambiguated record
Yoshikuni Okada
Also filed as: OKADA YOSHIKUNI
7 granted patents·1 pending application·29 citations·filing 2004–2011
81Inventor score
Top patents by PatentIndex Score
8 records- 0182US7990165B2Contact probe and method of making the sameNAT INST OF ADVANCED IND SCIEN·Filed 2007·Granted Aug 2, 2011·10 cites·4 claims
- 0273US7208966B2Contact probe, measuring pad used for the contact probe, and method of manufacturing the contact probeKIYOTA MFG CO·Filed 2005·Granted Apr 24, 2007·7 cites·7 claims
- 0367US7227352B2Contact probe, measuring pad used for the contact probe, and method of manufacturing the contact probeKIYOTA MFG CO·Filed 2006·Granted Jun 5, 2007·5 cites·2 claims
- 0465US7833835B2Multi-layer fin wiring interposer fabrication processNAT INST OF ADVANCED IND SCIEN·Filed 2007·Granted Nov 16, 2010·3 cites·4 claims
- 0556US7767574B2Method of forming micro metal bumpMIKUNI KOGYO KK·Filed 2007·Granted Aug 3, 2010·2 cites·9 claims
- 0653US7414422B2System in-package test inspection apparatus and test inspection methodNAT INST OF ADVANCED IND SCIEN·Filed 2005·Granted Aug 19, 2008·2 cites·5 claims
- 0739US9134346B2Method of making contact probeAOYAGI MASAHIRO·Filed 2011·Granted Sep 15, 2015·0 cites·15 claims
- 0839US2004256727A1Multi-layer fine wiring interposer and manufacturing method thereofFiled 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →