Inventor · disambiguated record
Yosuke Okudaira
Also filed as: OKUDAIRA YOSUKE
13 granted patents·2 pending applications·10 citations·filing 2014–2025
84Inventor score
Top patents by PatentIndex Score
15 records- 0184US10792147B2Ophthalmic lens and method of manufacturing ophthalmic lensNIKON CORP·Filed 2020·Granted Oct 6, 2020·2 cites·20 claims
- 0279US10522735B2Surveying instrumentTOPCON CORP·Filed 2017·Granted Dec 31, 2019·2 cites·9 claims
- 0376US10261304B2Structured illuminating microscopy apparatusNIKON CORP·Filed 2015·Granted Apr 16, 2019·2 cites·1 claims
- 0469US9523574B2Surveying instrumentKK TOPCON·Filed 2014·Granted Dec 20, 2016·3 cites·2 claims
- 0568US2022050283A1Structured illuminating microscopy apparatusNIKON CORP·Filed 2021·Application pending·0 cites
- 0663US10139224B2Measuring deviceTOPCON CORP·Filed 2016·Granted Nov 27, 2018·1 cites·8 claims
- 0763US2025305821A1Measurement deviceTOPCON CORP·Filed 2025·Application pending·0 cites
- 0861US11187883B2Structured illuminating microscopy apparatusNIKON CORP·Filed 2019·Granted Nov 30, 2021·0 cites·9 claims
- 0958US11972325B2Determination method, determination device, exposure device, and programNIKON CORP·Filed 2021·Granted Apr 30, 2024·0 cites·17 claims
- 1055US11703329B2Surveying instrument including guide light irradiation unitTOPCON CORP·Filed 2020·Granted Jul 18, 2023·0 cites·6 claims
- 1153US12248244B2Mask data generation method and mask data generation programNIKON CORP·Filed 2021·Granted Mar 11, 2025·0 cites·24 claims
- 1249US10281271B2Surveying instrumentTOPCON CORP·Filed 2017·Granted May 7, 2019·0 cites·5 claims
- 1348US10323940B2Tilt angle measuring deviceTOPCON CORP·Filed 2016·Granted Jun 18, 2019·0 cites·7 claims
- 1443US10067331B2Structured illumination microscope deviceNIKON CORP·Filed 2016·Granted Sep 4, 2018·0 cites·6 claims
- 1542US9919341B2Ultrasonic motor and surveying instrumentTOPCON CORP·Filed 2017·Granted Mar 20, 2018·0 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →