Inventor · disambiguated record
Yonatan Oren
Also filed as: OREN YONATAN
22 granted patents·6 pending applications·12 citations·filing 2016–2025
92Inventor score
Top patents by PatentIndex Score
28 records- 0192US12066385B2Raman spectroscopy based measurements in patterned structuresNOVA LTD·Filed 2022·Granted Aug 20, 2024·1 cites·16 claims
- 0292US11802829B2Method and system for broadband photoreflectance spectroscopyNOVA LTD·Filed 2020·Granted Oct 31, 2023·2 cites·10 claims
- 0392US11740183B2Accurate Raman spectroscopyNOVA LTD·Filed 2020·Granted Aug 29, 2023·2 cites·30 claims
- 0492US2025389665A1Hybrid metrology method and systemNOVA LTD·Filed 2025·Application pending·0 cites
- 0591US11293871B2Raman spectroscopy based measurement systemNOVA LTD·Filed 2018·Granted Apr 5, 2022·3 cites·26 claims
- 0690US12366533B2Hybrid metrology method and systemNOVA LTD·Filed 2024·Granted Jul 22, 2025·0 cites·23 claims
- 0790US2025123210A1Raman spectroscopy based measurements in patterned structuresNOVA LTD·Filed 2024·Application pending·0 cites
- 0889US2025130172A1Accurate raman spectroscopyNOVA LTD·Filed 2024·Application pending·0 cites
- 0987US12163892B2Accurate Raman spectroscopyNOVA LTD·Filed 2023·Granted Dec 10, 2024·0 cites·18 claims
- 1086US12298182B2Optical technique for material characterizationNOVA LTD·Filed 2024·Granted May 13, 2025·0 cites·20 claims
- 1185US12467869B2Raman spectroscopy based measurement systemNOVA LTD·Filed 2024·Granted Nov 11, 2025·0 cites·20 claims
- 1285US12372473B2Accurate Raman spectroscopyNOVA LTD·Filed 2024·Granted Jul 29, 2025·0 cites·18 claims
- 1385US10732116B2Hybrid metrology method and systemNOVA MEASURING INSTR LTD·Filed 2016·Granted Aug 4, 2020·2 cites·20 claims
- 1485US10564106B2Raman spectroscopy based measurements in patterned structuresNOVA MEASURING INSTR LTD·Filed 2016·Granted Feb 18, 2020·2 cites·13 claims
- 1582US11860104B2Accurate raman spectroscopyNOVA LTD·Filed 2022·Granted Jan 2, 2024·0 cites·19 claims
- 1681US11927481B2Optical technique for material characterizationNOVA LTD·Filed 2022·Granted Mar 12, 2024·0 cites·22 claims
- 1779US12025560B2Hybrid metrology method and systemNOVA LTD·Filed 2021·Granted Jul 2, 2024·0 cites·24 claims
- 1878US12152993B2Accurate Raman spectroscopyNOVA LTD·Filed 2021·Granted Nov 26, 2024·0 cites·20 claims
- 1978US11906434B2Raman spectroscopy based measurement systemNOVA LTD·Filed 2022·Granted Feb 20, 2024·0 cites·15 claims
- 2075US11150190B2Hybrid metrology method and systemNOVA LTD·Filed 2020·Granted Oct 19, 2021·0 cites·24 claims
- 2174US11415519B2Accurate Raman spectroscopyNOVA LTD·Filed 2020·Granted Aug 16, 2022·0 cites·20 claims
- 2273US11275027B2Raman spectroscopy based measurements in patterned structuresNOVA LTD·Filed 2020·Granted Mar 15, 2022·0 cites·20 claims
- 2366US11543294B2Optical technique for material characterizationNOVA LTD·Filed 2019·Granted Jan 3, 2023·0 cites·14 claims
- 2466US2025116605A1Accurate raman spectroscopyNOVA LTD·Filed 2024·Application pending·0 cites
- 2562US12359968B2Systems and methods for optical metrologyNOVA LTD·Filed 2021·Granted Jul 15, 2025·0 cites·14 claims
- 2657US2025207909A1Combined photothermal and ocd for semi-opaque structuresNOVA LTD·Filed 2023·Application pending·0 cites
- 2756US2025198840A1High frequency modulation chopperNOVA LTD·Filed 2023·Application pending·0 cites
- 2849US12392733B2Combined ocd and photoreflectance method and systemNOVA LTD·Filed 2020·Granted Aug 19, 2025·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →