Inventor · disambiguated record
Yoram Schwarz
Also filed as: SCHWARZ YORAM
10 granted patents·13 citations·filing 2007–2024
81Inventor score
Top patents by PatentIndex Score
10 records- 0185US12431333B2Systems, devices, and methods for aligning a particle beam and performing a non-contact electrical measurement on a cell and/or non-contact electrical measurement cell vehicle using a registration cellPDF SOLUTIONS INC·Filed 2024·Granted Sep 30, 2025·0 cites·5 claims
- 0279US12020897B2Systems, devices, and methods for aligning a particle beam and performing a non-contact electrical measurement on a cell and/or non-contact electrical measurement cell vehicle using a registration cellPDF SOLUTIONS INC·Filed 2023·Granted Jun 25, 2024·0 cites·10 claims
- 0378US8219349B1Test management systemSCHWARZ YORAM·Filed 2007·Granted Jul 10, 2012·11 cites·26 claims
- 0477US11605526B2Systems, devices, and methods for aligning a particle beam and performing a non-contact electrical measurement on a cell and/or non-contact electrical measurement cell vehicle using a registration cellPDF SOLUTIONS INC·Filed 2022·Granted Mar 14, 2023·0 cites·14 claims
- 0572US11328899B2Methods for aligning a particle beam and performing a non-contact electrical measurement on a cell using a registration cellPDF SOLUTIONS INC·Filed 2020·Granted May 10, 2022·0 cites·5 claims
- 0662US8683420B2Method and system of improved reliability testingWANG YUN·Filed 2010·Granted Mar 25, 2014·1 cites·13 claims
- 0758US8768643B2Method and apparatus for parallel testing of semiconductor devicesSCHWARZ YORAM·Filed 2011·Granted Jul 1, 2014·1 cites·6 claims
- 0854US8821795B2Combinatorial screening method and apparatusHASHIM IMRAN·Filed 2009·Granted Sep 2, 2014·0 cites·14 claims
- 0947US8815157B2Combinatorial screening methods and apparatusHASHIM IMRAN·Filed 2011·Granted Aug 26, 2014·0 cites·9 claims
- 1036US8575951B2Method for testing multiple couponsSCHWARZ YORAM·Filed 2011·Granted Nov 5, 2013·0 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →