Inventor · disambiguated record
Yoshifumi Taniguchi
Also filed as: TANIGUCHI YOSHIFUMI
26 granted patents·308 citations·filing 1980–2016
96Inventor score
Files withHITACHI HIGH TECH CORP12HITACHI LTD8TERADA SHOHEI3LEITH MITSUKO2HITACHI SCIENCE SYSTEMS LTD1
Top patents by PatentIndex Score
26 records- 0195US7381968B2Charged particle beam apparatus and specimen holderHITACHI HIGH TECH CORP·Filed 2005·Granted Jun 3, 2008·28 cites·10 claims
- 0291US4331213AAutomobile exhaust control systemLEITH MITSUKO·Filed 1980·Granted May 25, 1982·49 cites·16 claims
- 0389US6750451B2Observation apparatus and observation method using an electron beamHITACHI LTD·Filed 2002·Granted Jun 15, 2004·32 cites·5 claims
- 0487US7723682B2Transmission electron microscope provided with electronic spectroscopeHITACHI HIGH TECH CORP·Filed 2008·Granted May 25, 2010·9 cites·12 claims
- 0581US7235784B2Transmission electron microscope and image observation method using itHITACHI HIGH TECH CORP·Filed 2005·Granted Jun 26, 2007·11 cites·10 claims
- 0681US6930306B2Electron microscopeHITACHI HIGH TECH CORP·Filed 2004·Granted Aug 16, 2005·15 cites·10 claims
- 0780US7812310B2Charged particle beam apparatus and specimen holderHITACHI HIGH TECH CORP·Filed 2008·Granted Oct 12, 2010·4 cites·10 claims
- 0879US7622714B2Standard specimen for a charged particle beam apparatus, specimen preparation method thereof, and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2007·Granted Nov 24, 2009·6 cites·15 claims
- 0979US6150657AEnergy filter and electron microscope equipped with the energy filterHITACHI LTD·Filed 1998·Granted Nov 21, 2000·34 cites·15 claims
- 1077US9679738B2Electron microscopeHITACHI HIGH TECH CORP·Filed 2014·Granted Jun 13, 2017·3 cites·16 claims
- 1176US9558910B2Sample holder for electron microscopeHITACHI HIGH TECH CORP·Filed 2012·Granted Jan 31, 2017·3 cites·9 claims
- 1274US6992286B2Material characterization systemHITACHI SCIENCE SYSTEMS LTD·Filed 2004·Granted Jan 31, 2006·11 cites·13 claims
- 1373US8436301B2Transmission electron microscope having electron spectrometerTERADA SHOHEI·Filed 2009·Granted May 7, 2013·3 cites·8 claims
- 1472US5578823ATransmission electron microscope and method of observing element distribution by using the sameHITACHI LTD·Filed 1995·Granted Nov 26, 1996·25 cites·13 claims
- 1570US5981948ATransmission electron microscope and method of observing element distributionHITACHI LTD·Filed 1998·Granted Nov 9, 1999·21 cites·8 claims
- 1669US8263936B2Transmission electron microscope having electron spectroscopeTERADA SHOHEI·Filed 2009·Granted Sep 11, 2012·2 cites·7 claims
- 1760USD636005SElectron microscopeHITACHI HIGH TECH CORP·Filed 2010·Granted Apr 12, 2011·11 cites·1 claims
- 1860US7385198B2Method and apparatus for measuring the physical properties of micro regionHITACHI LTD·Filed 2006·Granted Jun 10, 2008·1 cites·11 claims
- 1958US10636621B2Charged particle beam device for moving an aperture having plurality of openings and sample observation methodHITACHI HIGH TECH CORP·Filed 2015·Granted Apr 28, 2020·1 cites·4 claims
- 2057US6855927B2Method and apparatus for observing element distributionHITACHI HIGH TECH CORP·Filed 2003·Granted Feb 15, 2005·3 cites·6 claims
- 2154US6066852AElectron energy filterHITACHI LTD·Filed 1995·Granted May 23, 2000·11 cites·25 claims
- 2253US8530858B2Transmission electron microscope apparatus comprising electron spectroscope, sample holder, sample stage, and method for acquiring spectral imageTERADA SHOHEI·Filed 2009·Granted Sep 10, 2013·0 cites·14 claims
- 2353US7022988B2Method and apparatus for measuring physical properties of micro regionHITACHI LTD·Filed 2001·Granted Apr 4, 2006·4 cites·4 claims
- 2452US5585630AElectron energy filter and transmission electron microscope provided with the sameHITACHI LTD·Filed 1995·Granted Dec 17, 1996·10 cites·11 claims
- 2543US10535497B2Electron microscope and imaging methodHITACHI HIGH TECH CORP·Filed 2016·Granted Jan 14, 2020·0 cites·14 claims
- 2641US4303143AExhaust gas control systemLEITH MITSUKO·Filed 1980·Granted Dec 1, 1981·11 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →