Inventor · disambiguated record
Yoichi Tobita
Also filed as: TOBITA YOICHI
10 granted patents·415 citations·filing 1986–1997
92Inventor score
Files withMITSUBISHI ELECTRIC CORP10
Top patents by PatentIndex Score
10 records- 0195US4933907ADynamic random access memory device and operating method thereforMITSUBISHI ELECTRIC CORP·Filed 1988·Granted Jun 12, 1990·104 cites·19 claims
- 0284US4984206ARandom access memory with reduced access time in reading operation and operating method thereofMITSUBISHI ELECTRIC CORP·Filed 1989·Granted Jan 8, 1991·46 cites·32 claims
- 0383US5041898AInterconnection layer formed on embedded dielectric and method for manufacturing the sameMITSUBISHI ELECTRIC CORP·Filed 1988·Granted Aug 20, 1991·64 cites·22 claims
- 0482US5544102ASemiconductor memory device including stabilizing capacitive elements each having a MOS capacitor structureMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Aug 6, 1996·48 cites·6 claims
- 0579US5051995ASemiconductor memory device having a test mode setting circuitMITSUBISHI ELECTRIC CORP·Filed 1989·Granted Sep 24, 1991·31 cites·8 claims
- 0677US4670706AConstant voltage generating circuitMITSUBISHI ELECTRIC CORP·Filed 1986·Granted Jun 2, 1987·24 cites·17 claims
- 0773US5892390AInternal power supply circuit with low power consumptionMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Apr 6, 1999·29 cites·19 claims
- 0872US5646516AReference voltage generating circuitMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Jul 8, 1997·35 cites·21 claims
- 0962US5490116ASemiconductor memory device including a component having improved breakdown voltage characteristicsMITSUBISHI ELECTRIC CORP·Filed 1993·Granted Feb 6, 1996·19 cites·9 claims
- 1053USRE35645ESemiconductor memory device having a test mode setting circuitMITSUBISHI ELECTRIC CORP·Filed 1993·Granted Oct 28, 1997·15 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →