Inventor · disambiguated record
Yoshio Yanase
Also filed as: YANASE YOSHIO
2 granted patents·1 pending application·13 citations·filing 2000–2007
52Inventor score
Technology areasH10P
Top patents by PatentIndex Score
3 records- 0167US6726319B1Method for inspecting surface of semiconductor waferSUMITOMO MITSUBISHI SILICON·Filed 2000·Granted Apr 27, 2004·13 cites·25 claims
- 0243US2008048300A1Silicon epitaxial wafer and method for manufacturing the sameSUMCO CORP·Filed 2007·Application pending·0 cites
- 0341US7709357B2Silicon epitaxial wafer and method for manufacturing the sameSUMCO CORP·Filed 2005·Granted May 4, 2010·0 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →