Inventor · disambiguated record
Yuchen Deng
Also filed as: DENG YUCHEN
14 granted patents·6 pending applications·19 citations·filing 2019–2025
87Inventor score
Files withFEI CO20
Top patents by PatentIndex Score
20 records- 0196US11460419B2Electron diffraction holographyFEI CO·Filed 2020·Granted Oct 4, 2022·4 cites·20 claims
- 0296US11183364B1Dual beam microscope system for imaging during sample processingFEI CO·Filed 2020·Granted Nov 23, 2021·7 cites·19 claims
- 0395US11906450B2Electron diffraction holographyFEI CO·Filed 2022·Granted Feb 20, 2024·2 cites·20 claims
- 0487US12216068B2Bifocal electron microscopeFEI CO·Filed 2024·Granted Feb 4, 2025·0 cites·20 claims
- 0585US10937625B2Method of imaging a sample using an electron microscopeFEI CO·Filed 2019·Granted Mar 2, 2021·4 cites·19 claims
- 0680US2025378543A1Area selection in charged particle microscope imagingFEI CO·Filed 2025·Application pending·0 cites
- 0779US10923308B1Method and system for energy resolved chroma imagingFEI CO·Filed 2019·Granted Feb 16, 2021·2 cites·19 claims
- 0874US2025155387A1Bifocal electron microscopeFEI CO·Filed 2025·Application pending·0 cites
- 0967US11799486B2Systems and methods for quantum computing based sample analysisFEI CO·Filed 2022·Granted Oct 24, 2023·0 cites·19 claims
- 1066US12347083B2Area selection in charged particle microscope imagingFEI CO·Filed 2021·Granted Jul 1, 2025·0 cites·21 claims
- 1165US11887809B2Auto-tuning stage settling time with feedback in charged particle microscopyFEI CO·Filed 2022·Granted Jan 30, 2024·0 cites·20 claims
- 1263US11456149B2Methods and systems for acquiring 3D diffraction dataFEI CO·Filed 2020·Granted Sep 27, 2022·0 cites·19 claims
- 1362US11715618B2System and method for reducing the charging effect in a transmission electron microscope systemFEI CO·Filed 2021·Granted Aug 1, 2023·0 cites·20 claims
- 1462US2025125116A1Correction of optical aberrations in charged particle beam microscopyFEI CO·Filed 2024·Application pending·0 cites
- 1561US12327342B2Automatic particle beam focusingFEI CO·Filed 2022·Granted Jun 10, 2025·0 cites·19 claims
- 1657US11404241B2Simultaneous TEM and STEM microscopeFEI CO·Filed 2020·Granted Aug 2, 2022·0 cites·20 claims
- 1753US2024128050A1Method of automated data acquisition for a transmission electron microscopeFEI CO·Filed 2023·Application pending·0 cites
- 1852US2024071051A1Automated Selection And Model Training For Charged Particle Microscope ImagingFEI CO·Filed 2022·Application pending·0 cites
- 1951US11501197B2Systems and methods for quantum computing based sample analysisFEI CO·Filed 2019·Granted Nov 15, 2022·0 cites·19 claims
- 2045US2021305007A1Dual beam bifocal charged particle microscopeFEI CO·Filed 2020·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →