Inventor · disambiguated record
Yukihiko Fukasawa
Also filed as: FUKASAWA YUKIHIKO
4 granted patents·194 citations·filing 1989–2009
79Inventor score
Top patents by PatentIndex Score
4 records- 0191US6111421AProbe method and apparatus for inspecting an objectTOKYO ELECTRON LTD·Filed 1998·Granted Aug 29, 2000·114 cites·25 claims
- 0283US6963208B2Probe device, probe card channel information creation program, and probe card information creation deviceTOKYO ELECTRON LTD·Filed 2005·Granted Nov 8, 2005·10 cites·19 claims
- 0383US4945424APower switching arrangement for video camera apparatusCASIO COMPUTER CO LTD·Filed 1989·Granted Jul 31, 1990·66 cites·15 claims
- 0472US7969172B2Probing method and probing programTOKYO ELECTRON LTD·Filed 2009·Granted Jun 28, 2011·4 cites·10 claims
Join the waitlist — get patent alerts
Get an alert when Yukihiko Fukasawa files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →