Inventor · disambiguated record
Yunbo Guo
Also filed as: GUO YUNBO
9 granted patents·3 pending applications·40 citations·filing 2007–2023
84Inventor score
Top patents by PatentIndex Score
12 records- 0191US11422473B2Utilize pattern recognition to improve SEM contour measurement accuracy and stability automaticallyASML NETHERLANDS BV·Filed 2019·Granted Aug 23, 2022·5 cites·20 claims
- 0289US9157856B2Integrated photonic crystal structures and their applicationsGUO YUNBO·Filed 2013·Granted Oct 13, 2015·12 cites·20 claims
- 0386US10610846B2Two-dimensional photonic crystal microarray measurement method and apparatus for highly-sensitive label-free multiple analyte sensing, biosensing, and diagnostic assayCHAKRAVARTY SWAPNAJIT·Filed 2014·Granted Apr 7, 2020·5 cites·18 claims
- 0483US7639362B2Photonic crystal sensorUNIV MICHIGAN·Filed 2007·Granted Dec 29, 2009·10 cites·22 claims
- 0582US9581592B2SERS, fluorescence, absorption, and luminescence detection with flow-through multi-hole capillariesUNIV MICHIGAN REGENTS·Filed 2012·Granted Feb 28, 2017·5 cites·15 claims
- 0670US9223064B2Photonic crystal-metallic structures and applicationsGUO YUNBO·Filed 2011·Granted Dec 29, 2015·3 cites·23 claims
- 0763US11097246B2Two-dimensional photonic crystal MicroArray measurement method and apparatus for highly-sensitive label-free multiple analyte sensing, biosensing, and diagnostic assayCHAKRAVARTY SWAPNAJIT·Filed 2020·Granted Aug 24, 2021·0 cites·18 claims
- 0858US2024377343A1Method for converting metrology dataASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 0954US11977336B2Method for improving a process for a patterning processASML NETHERLANDS BV·Filed 2019·Granted May 7, 2024·0 cites·21 claims
- 1048US2025166166A1Systems and methods for defect location binning in charged-particle systemsASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 1145US9103727B2Composite Fabry-Pérot sensorUNIV MICHIGAN·Filed 2012·Granted Aug 11, 2015·0 cites·14 claims
- 1242US2015002346A1Integrated Printed Decorative Antenna And ElectronicsSUBBARAMAN HARISH·Filed 2014·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →