Inventor · disambiguated record
Yukari Imai
Also filed as: IMAI YUKARI
8 granted patents·2 pending applications·71 citations·filing 1993–2012
85Inventor score
Top patents by PatentIndex Score
10 records- 0167US5434813ASemiconductor memory device and manufacturing method of the sameMITSUBISHI ELECTRIC CORP·Filed 1993·Granted Jul 18, 1995·26 cites·32 claims
- 0261US5633184AMethod of making semiconductor device with floating bateMITSUBISHI ELECTRIC CORP·Filed 1995·Granted May 27, 1997·21 cites·20 claims
- 0360US8158473B2Method for manufacturing a semiconductor device having a silicide region comprised of a silicide of a nickel alloyICHINOSE KAZUHITO·Filed 2010·Granted Apr 17, 2012·1 cites·7 claims
- 0450US6745618B2Scanning probe microscopeRENESAS TECH CORP·Filed 2002·Granted Jun 8, 2004·6 cites·1 claims
- 0549US8344511B2Method for manufacturing a semiconductor device having a silicide region comprised of a silicide of a nickel alloyRENESAS ELECTRONICS CORP·Filed 2012·Granted Jan 1, 2013·0 cites·3 claims
- 0644US5677204AMethod of evaluating a thin film for use in semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Oct 14, 1997·12 cites·15 claims
- 0738US6545470B2Scanning probe microscopeMITSUBISHI ELECTRIC CORP·Filed 2002·Granted Apr 8, 2003·3 cites·10 claims
- 0835US2004103353A1Failure analysis methodRENESAS TECH CORP·Filed 2003·Application pending·0 cites
- 0932US2003057988A1Semiconductor device inspecting method using conducting AFMMITSUBISHI ELECTRIC CORP·Filed 2002·Application pending·0 cites
- 1029US5850149AEvaluation method for semiconductor devicesMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Dec 15, 1998·2 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →