Inventor · disambiguated record
Yuichi Madokoro
Also filed as: MADOKORO YUICHI
27 granted patents·754 citations·filing 1997–2021
97Inventor score
Files withHITACHI LTD14HITACHI HIGH TECH CORP7MADOKORO YUICHI3TOMIMATSU SATOSHI2HITACHI HIGH TECH SCIENCE CORP1
Top patents by PatentIndex Score
27 records- 0198US7138628B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2006·Granted Nov 21, 2006·35 cites·24 claims
- 0298US6538254B1Method and apparatus for sample fabricationHITACHI LTD·Filed 1998·Granted Mar 25, 2003·315 cites·19 claims
- 0397US7071475B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2004·Granted Jul 4, 2006·61 cites·8 claims
- 0497US6828566B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2003·Granted Dec 7, 2004·62 cites·24 claims
- 0596US7176458B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2006·Granted Feb 13, 2007·18 cites·13 claims
- 0695US7525108B2Focused ion beam apparatus for specimen fabricationHITACHI LTD·Filed 2007·Granted Apr 28, 2009·16 cites·30 claims
- 0795US7397050B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2007·Granted Jul 8, 2008·16 cites·25 claims
- 0895US7397052B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2007·Granted Jul 8, 2008·16 cites·11 claims
- 0995US6822245B2Ion beam apparatus and sample processing methodHITACHI LTD·Filed 2001·Granted Nov 23, 2004·60 cites·25 claims
- 1094US7084399B2Ion beam apparatus and sample processing methodHITACHI LTD·Filed 2004·Granted Aug 1, 2006·52 cites·19 claims
- 1192US7397051B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2007·Granted Jul 8, 2008·8 cites·9 claims
- 1291US8569719B2Method and apparatus for specimen fabricationTOMIMATSU SATOSHI·Filed 2011·Granted Oct 29, 2013·6 cites·18 claims
- 1391US7420181B2Liquid metal ion gunHITACHI HIGH TECH CORP·Filed 2007·Granted Sep 2, 2008·10 cites·13 claims
- 1488US7211805B2Liquid metal ion gunHITACHI HIGH TECH CORP·Filed 2005·Granted May 1, 2007·8 cites·3 claims
- 1586US8405053B2Method and apparatus for specimen fabricationTOMIMATSU SATOSHI·Filed 2011·Granted Mar 26, 2013·4 cites·3 claims
- 1686US7999240B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2008·Granted Aug 16, 2011·4 cites·14 claims
- 1786US7189982B2Focused ion beam apparatus and apertureHITACHI HIGH TECH CORP·Filed 2005·Granted Mar 13, 2007·8 cites·10 claims
- 1884US7804073B2Liquid metal ion gunHITACHI HIGH TECH CORP·Filed 2008·Granted Sep 28, 2010·5 cites·13 claims
- 1984US7791050B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2008·Granted Sep 7, 2010·4 cites·36 claims
- 2083US8629394B2Charged particle beam device and method for correcting position with respect to charged particle beamMADOKORO YUICHI·Filed 2009·Granted Jan 14, 2014·9 cites·17 claims
- 2182US7005651B2Liquid metal ion gunHITACHI HIGH TECH CORP·Filed 2004·Granted Feb 28, 2006·12 cites·8 claims
- 2278US7235798B2Focused ion beam apparatusHITACHI HIGH TECH CORP·Filed 2005·Granted Jun 26, 2007·4 cites·7 claims
- 2372US7435972B2Focused ion beam apparatus and liquid metal ion sourceHITACHI HIGH TECH CORP·Filed 2007·Granted Oct 14, 2008·2 cites·8 claims
- 2468US8552397B2Focused ion beam device and focused ion beam processing methodMADOKORO YUICHI·Filed 2010·Granted Oct 8, 2013·3 cites·22 claims
- 2564US5910871AMagnetic head having track width specified by grooves formed with projection ion beamHITACHI LTD·Filed 1997·Granted Jun 8, 1999·16 cites·6 claims
- 2657US11682536B2Particle beam apparatus and composite beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2021·Granted Jun 20, 2023·0 cites·6 claims
- 2751US8710464B2Specimen preparation device, and control method in specimen preparation deviceMADOKORO YUICHI·Filed 2009·Granted Apr 29, 2014·0 cites·25 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →