Inventor · disambiguated record
Yuta Nagai
Also filed as: NAGAI YUTA
1 granted patent·1 pending application·2 citations·filing 2014–2017
17Inventor score
Technology areasH10P
Files withGLOBALWAFERS JAPAN CO LTD2
Top patents by PatentIndex Score
2 records- 0162US10330599B2Calibration curve determination method, carbon concentration measurement method, and silicon wafer-manufacturing methodGLOBALWAFERS JAPAN CO LTD·Filed 2017·Granted Jun 25, 2019·2 cites·10 claims
- 0234US2015017086A1Silicon single crystal and method for manufacture thereofGLOBALWAFERS JAPAN CO LTD·Filed 2014·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →