Inventor · disambiguated record
Yu-Ho Ni
Also filed as: NI YU-HO
6 granted patents·1 pending application·4 citations·filing 2016–2020
71Inventor score
Files withADVANCED ION BEAM TECH INC7
Top patents by PatentIndex Score
7 records- 0173US10984524B2Calibration system with at least one camera and method thereofADVANCED ION BEAM TECH INC·Filed 2018·Granted Apr 20, 2021·2 cites·29 claims
- 0269US11062926B2Wafer charges monitoringADVANCED ION BEAM TECH INC·Filed 2019·Granted Jul 13, 2021·1 cites·14 claims
- 0365US10804821B2Apparatus and method for monitoring the relative relationship between the wafer and the chuckADVANCED ION BEAM TECH INC·Filed 2017·Granted Oct 13, 2020·1 cites·6 claims
- 0458US11349414B2Apparatus and method for monitoring the relative relationship between the wafer and the chuckADVANCED ION BEAM TECH INC·Filed 2020·Granted May 31, 2022·0 cites·13 claims
- 0549US10475678B2Wafer charges monitoringADVANCED ION BEAM TECH INC·Filed 2018·Granted Nov 12, 2019·0 cites·16 claims
- 0644US2019301661A1Vacuum jacketed tubeADVANCED ION BEAM TECH INC·Filed 2019·Application pending·0 cites
- 0736US10699876B2Method of cleaning electrostatic chuckADVANCED ION BEAM TECH INC·Filed 2016·Granted Jun 30, 2020·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →