Inventor · disambiguated record
Yusuke Ominami
Also filed as: OMINAMI YUSUKE
36 granted patents·4 pending applications·87 citations·filing 2008–2017
96Inventor score
Top patents by PatentIndex Score
40 records- 0193US8710439B2Charged particle beam apparatusOMINAMI YUSUKE·Filed 2012·Granted Apr 29, 2014·15 cites·23 claims
- 0289US9508527B2Sample base, charged particle beam device and sample observation methodHITACHI HIGH TECH CORP·Filed 2013·Granted Nov 29, 2016·8 cites·17 claims
- 0385US8835847B2Sample holding apparatus for electron microscope, and electron microscope apparatusYAGUCHI TOSHIE·Filed 2012·Granted Sep 16, 2014·8 cites·20 claims
- 0483US10241062B2Charged particle beam device, sample observation method, sample platform, observation system, and light emitting memberHITACHI HIGH TECH CORP·Filed 2014·Granted Mar 26, 2019·4 cites·23 claims
- 0583US8933400B2Inspection or observation apparatus and sample inspection or observation methodOMINAMI YUSUKE·Filed 2012·Granted Jan 13, 2015·5 cites·13 claims
- 0681US9418818B2Charged particle beam device and sample observation methodHITACHI HIGH TECH CORP·Filed 2013·Granted Aug 16, 2016·4 cites·18 claims
- 0781US8921786B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2014·Granted Dec 30, 2014·3 cites·20 claims
- 0877US8421008B2Pattern check device and pattern check methodNOZOE MARI·Filed 2009·Granted Apr 16, 2013·7 cites·16 claims
- 0976US10431416B2Observation support unit for charged particle microscope and sample observation method using sameHITACHI HIGH TECH CORP·Filed 2015·Granted Oct 1, 2019·2 cites·21 claims
- 1076US9472375B2Charged particle beam device, sample stage unit, and sample observation methodHITACHI HIGH TECH CORP·Filed 2013·Granted Oct 18, 2016·3 cites·15 claims
- 1172US9543111B2Charged particle beam deviceOMINAMI YUSUKE·Filed 2011·Granted Jan 10, 2017·3 cites·23 claims
- 1272US8086022B2Electron beam inspection system and an image generation method for an electron beam inspection systemMIYAI HIROSHI·Filed 2008·Granted Dec 27, 2011·4 cites·8 claims
- 1370US8086021B2Appearance inspection apparatus with scanning electron microscope and image data processing method using scanning electron microscopeOMINAMI YUSUKE·Filed 2009·Granted Dec 27, 2011·2 cites·17 claims
- 1467US9741530B2Charged-particle-beam device, specimen-image acquisition method, and program recording mediumHITACHI HIGH TECH CORP·Filed 2014·Granted Aug 22, 2017·1 cites·20 claims
- 1566US9633817B2Diaphragm mounting member and charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2014·Granted Apr 25, 2017·1 cites·16 claims
- 1666US9466460B2Charged particle-beam device and specimen observation methodHITACHI HIGH TECH CORP·Filed 2014·Granted Oct 11, 2016·1 cites·22 claims
- 1765US7838828B2Semiconductor device inspection apparatusHITACHI HIGH TECH CORP·Filed 2008·Granted Nov 23, 2010·4 cites·5 claims
- 1862US9105442B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2014·Granted Aug 11, 2015·0 cites·17 claims
- 1960US9236217B2Inspection or observation apparatus and sample inspection or observation methodHITACHI HIGH TECH CORP·Filed 2014·Granted Jan 12, 2016·0 cites·3 claims
- 2057US10157724B2Electron scanning microscope and image generation methodHITACHI HIGH TECH CORP·Filed 2017·Granted Dec 18, 2018·0 cites·8 claims
- 2154US9165741B2Charged particle beam device, method for adjusting charged particle beam device, and method for inspecting or observing sampleOMINAMI YUSUKE·Filed 2012·Granted Oct 20, 2015·0 cites·18 claims
- 2253US9824854B2Charged particle beam device, image generation method, observation systemHITACHI HIGH TECH CORP·Filed 2014·Granted Nov 21, 2017·0 cites·18 claims
- 2353US9673020B2Charged particle beam device, method for adjusting charged particle beam device, and method for inspecting or observing sampleHITACHI HIGH TECH CORP·Filed 2015·Granted Jun 6, 2017·0 cites·16 claims
- 2449US9466457B2Observation apparatus and optical axis adjustment methodHITACHI HIGH TECH CORP·Filed 2013·Granted Oct 11, 2016·0 cites·16 claims
- 2549US9373480B2Charged particle beam device and filter memberHITACHI HIGH TECH CORP·Filed 2014·Granted Jun 21, 2016·0 cites·11 claims
- 2649US9251996B2Charged particle beam device, position adjusting method for diaphragm, and diaphragm position adjusting jigHITACHI HIGH TECH CORP·Filed 2013·Granted Feb 2, 2016·0 cites·18 claims
- 2749USD748706SThin membrane holder for an electron microscopeHITACHI HIGH TECH CORP·Filed 2014·Granted Feb 2, 2016·6 cites·1 claims
- 2849US9240305B2Charged particle beam device and sample observation methodHITACHI HIGH TECH CORP·Filed 2013·Granted Jan 19, 2016·0 cites·17 claims
- 2949USD730962SBase of a thin membrane holder for an electron microscopeHITACHI HIGH TECH CORP·Filed 2014·Granted Jun 2, 2015·6 cites·1 claims
- 3048US9564288B2Sample storage container, charged particle beam apparatus, and image acquiring methodHITACHI HIGH TECH CORP·Filed 2013·Granted Feb 7, 2017·0 cites·14 claims
- 3148US9208995B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2013·Granted Dec 8, 2015·0 cites·14 claims
- 3246US9741526B2Charged particle beam apparatus and sample image acquiring methodHITACHI HIGH TECH CORP·Filed 2014·Granted Aug 22, 2017·0 cites·6 claims
- 3346US8242443B2Semiconductor device inspection apparatusOMINAMI YUSUKE·Filed 2010·Granted Aug 14, 2012·0 cites·4 claims
- 3445US9362083B2Charged particle beam apparatus and sample observation methodHITACHI HIGH TECH CORP·Filed 2013·Granted Jun 7, 2016·0 cites·17 claims
- 3545US9263232B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2013·Granted Feb 16, 2016·0 cites·15 claims
- 3645US2015206705A1Member for charged particle beam device, charged particle beam device and diaphragm memberHITACHI HIGH TECH CORP·Filed 2013·Application pending·0 cites
- 3744US2015213999A1Charged Particle Beam ApparatusHITACHI HIGH TECH CORP·Filed 2013·Application pending·0 cites
- 3840US8658987B2Circuit-pattern inspection deviceYAMAMOTO TAKUMA·Filed 2011·Granted Feb 25, 2014·0 cites·15 claims
- 3938US2012091339A1Charged-particle microscope device, and method of controlling charged-particle beamsOMINAMI YUSUKE·Filed 2010·Application pending·0 cites
- 4037US2012292506A1Sample observation method using electron beams and electron microscopeTSUNO NATSUKI·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →