Inventor · disambiguated record
Yuan-Chi Pai
Also filed as: PAI YUAN-CHI
22 granted patents·4 pending applications·143 citations·filing 1998–2023
93Inventor score
Files withUNITED MICROELECTRONICS CORP11UNITED SEMICONDUCTOR XIAMEN CO LTD9CHEN YI-TING1CHIANG YI-CHIH1HUANG YONG-FA1
Top patents by PatentIndex Score
26 records- 0183US11527438B2Manufacturing method of contact structureUNITED SEMICONDUCTOR XIAMEN CO LTD·Filed 2020·Granted Dec 13, 2022·2 cites·20 claims
- 0283US6376872B1Focusing and color-filtering structure for semiconductor light-sensitive deviceFiled 2000·Granted Apr 23, 2002·32 cites·9 claims
- 0379US12216072B2Reticle thermal expansion calibration method capable of improving sub-recipeUNITED SEMICONDUCTOR XIAMEN CO LTD·Filed 2021·Granted Feb 4, 2025·1 cites·10 claims
- 0479US11692946B2Method for aligning to a pattern on a waferUNITED SEMICONDUCTOR XIAMEN CO LTD·Filed 2021·Granted Jul 4, 2023·1 cites·16 claims
- 0579US8564143B2Overlay mark for multiple pre-layers and currently layerCHEN YI-TING·Filed 2012·Granted Oct 22, 2013·3 cites·11 claims
- 0675US9400435B2Method of correcting overlay errorUNITED MICROELECTRONICS CORP·Filed 2014·Granted Jul 26, 2016·2 cites·21 claims
- 0770US12204247B2Lithography film stack and lithography methodUNITED SEMICONDUCTOR XIAMEN CO LTD·Filed 2023·Granted Jan 21, 2025·0 cites·20 claims
- 0864US6242277B1Method of fabricating a complementary metal-oxide semiconductor sensor deviceUNITED MICROELECTRONICS CORP·Filed 1998·Granted Jun 5, 2001·34 cites·21 claims
- 0960US6251700B1Method of manufacturing complementary metal-oxide-semiconductor photosensitive deviceUNITED MICROELECTRONICS CORP·Filed 1998·Granted Jun 26, 2001·26 cites·20 claims
- 1059US6133062AMethod of fabricating focusing and color-filtering structure for semiconductor light-sensitive deviceUNITED MICROELECTRONICS CORP·Filed 1998·Granted Oct 17, 2000·21 cites·22 claims
- 1155US8524423B2Method of forming assist feature patternsCHIANG YI-CHIH·Filed 2011·Granted Sep 3, 2013·1 cites·16 claims
- 1254US12394673B2Semiconductor manufacturing processUNITED SEMICONDUCTOR XIAMEN CO LTD·Filed 2022·Granted Aug 19, 2025·0 cites·10 claims
- 1354US2025044693A1Method for coating top anti-reflective coatingUNITED SEMICONDUCTOR XIAMEN CO LTD·Filed 2023·Application pending·0 cites
- 1452US12020932B2Photoresist coating methodUNITED SEMICONDUCTOR XIAMEN CO LTD·Filed 2022·Granted Jun 25, 2024·0 cites·8 claims
- 1552US6261861B1Processing flow of a complementary metal-oxide semiconductor color filterUNITED MICROELECTRONICS CORP·Filed 1998·Granted Jul 17, 2001·17 cites·23 claims
- 1652US2024202875A1Method of detecting wafer defects based on singularly valuable decompositionUNITED SEMICONDUCTOR XIAMEN CO LTD·Filed 2023·Application pending·0 cites
- 1750US9494873B2Asymmetry compensation method used in lithography overlay processUNITED MICROELECTRONICS CORP·Filed 2014·Granted Nov 15, 2016·0 cites·13 claims
- 1848US9448471B2Photo-mask and method of manufacturing semiconductor structures by using the sameUNITED MICROELECTRONICS CORP·Filed 2014·Granted Sep 20, 2016·0 cites·20 claims
- 1946US8785115B2Photoresist removal method and patterning process utilizing the sameWU HUNG-YI·Filed 2012·Granted Jul 22, 2014·0 cites·16 claims
- 2045US9305847B2Method of manufacturing semiconductor device having gate metalUNITED MICROELECTRONICS CORP·Filed 2014·Granted Apr 5, 2016·0 cites·10 claims
- 2144US2023123680A1Correction and compensation method in semiconductor manufacturing processUNITED SEMICONDUCTOR XIAMEN CO LTD·Filed 2021·Application pending·0 cites
- 2242US9245972B2Method for manufacturing semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2013·Granted Jan 26, 2016·0 cites·19 claims
- 2339US2014120476A1Method of forming a photoresist patternUNITED MICROELECTRONICS CORP·Filed 2012·Application pending·0 cites
- 2435US8476004B2Method for forming photoresist patternsHUANG YONG-FA·Filed 2011·Granted Jul 2, 2013·0 cites·16 claims
- 2525US6410447B2Process for removing photoresist materialUNITED MICROELECTRONICS CROP·Filed 1999·Granted Jun 25, 2002·3 cites·18 claims
- 2623US6194324B1Method for in-situ removing photoresist materialUNITED MICROELECTRONICS CORP·Filed 1999·Granted Feb 27, 2001·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →