Inventor · disambiguated record
Yukihiro Urakawa
Also filed as: URAKAWA YUKIHIRO
39 granted patents·9 pending applications·776 citations·filing 1989–2024
98Inventor score
Top patents by PatentIndex Score
48 records- 0198US7424695B2Method of manufacturing a semiconductor integrated circuit, a program for a computer automated design system, and a semiconductor integrated circuitTOSHIBA KK·Filed 2006·Granted Sep 9, 2008·123 cites·7 claims
- 0294US6414525B2I/O interface circuit, semiconductor chip and semiconductor systemTOSHIBA KK·Filed 2001·Granted Jul 2, 2002·56 cites·8 claims
- 0393US6781805B1Stacked MOSFET protection circuitTOSHIBA KK·Filed 2000·Granted Aug 24, 2004·82 cites·18 claims
- 0493US6737743B2Memory chip and semiconductor device using the memory chip and manufacturing method of thoseTOSHIBA KK·Filed 2002·Granted May 18, 2004·59 cites·9 claims
- 0592US7353481B2Computer implemented method for designing a semiconductor integrated circuit and a semiconductor integrated circuitTOSHIBA KK·Filed 2005·Granted Apr 1, 2008·25 cites·17 claims
- 0687US8208325B2Semiconductor device, semiconductor package and memory repair methodURAKAWA YUKIHIRO·Filed 2010·Granted Jun 26, 2012·12 cites·20 claims
- 0786US6278300B1I/O interface circuit, semiconductor chip and semiconductor systemTOSHIBA KK·Filed 1998·Granted Aug 21, 2001·43 cites·14 claims
- 0886US6246617B1Semiconductor memory device capable of recovering defective bit and a system having the same semiconductor memory deviceTOSHIBA KK·Filed 2000·Granted Jun 12, 2001·32 cites·19 claims
- 0983US8237289B2System in package deviceURAKAWA YUKIHIRO·Filed 2008·Granted Aug 7, 2012·12 cites·13 claims
- 1083US6718496B1Self-repairing semiconductor device having a testing unit for testing under various operating conditionsTOSHIBA KK·Filed 2000·Granted Apr 6, 2004·46 cites·21 claims
- 1182US4992681ALogic level converting circuitTOSHIBA KK·Filed 1989·Granted Feb 12, 1991·30 cites·8 claims
- 1281US6462995B2Semiconductor memory device capable of recovering defective bit and a system having the same semiconductor memory deviceTOSHIBA KK·Filed 2001·Granted Oct 8, 2002·23 cites·20 claims
- 1379US7251765B2Semiconductor integrated circuit and method for testing a semiconductor integrated circuitTOSHIBA KK·Filed 2004·Granted Jul 31, 2007·22 cites·18 claims
- 1478US8232622B2Stacked-chip deviceURAKAWA YUKIHIRO·Filed 2009·Granted Jul 31, 2012·7 cites·8 claims
- 1578US6578179B2LSI layout design apparatus, layout design method, recording medium recording layout design program, and semiconductor integrated circuitTOSHIBA KK·Filed 2001·Granted Jun 10, 2003·28 cites·13 claims
- 1677US7392152B2Semiconductor integrated circuitTOSHIBA KK·Filed 2005·Granted Jun 24, 2008·6 cites·19 claims
- 1774US7501689B2Upper-layer metal power standard cellTOSHIBA KK·Filed 2005·Granted Mar 10, 2009·6 cites·19 claims
- 1873US7490018B2Thermal management systemTOSHIBA KK·Filed 2007·Granted Feb 10, 2009·5 cites·17 claims
- 1972US6324106B2Semiconductor memory device capable of recovering defective bit and a system having the same semiconductor memory deviceTOSHIBA KK·Filed 2001·Granted Nov 27, 2001·14 cites·1 claims
- 2070US5512772ASemiconductor device having bipolar transistor and MOS transistorTOSHIBA KK·Filed 1994·Granted Apr 30, 1996·27 cites·9 claims
- 2164US5049806ABand-gap type voltage generating circuit for an ECL circuitTOSHIBA KK·Filed 1989·Granted Sep 17, 1991·22 cites·10 claims
- 2264US2025322224A1Physical reservoir element, physical reservoir, and information processing deviceTDK CORP·Filed 2024·Application pending·0 cites
- 2361US8867868B2Semiconductor integrated circuitKUSHIYAMA NATSUKI·Filed 2007·Granted Oct 21, 2014·3 cites·14 claims
- 2461US7977159B2Memory chip and semiconductor device using the memory chip and manufacturing method of thoseTOSHIBA KK·Filed 2006·Granted Jul 12, 2011·3 cites·19 claims
- 2561US7525132B2Semiconductor integrated circuit wiring design method and semiconductor integrated circuitTOSHIBA KK·Filed 2007·Granted Apr 28, 2009·2 cites·6 claims
- 2661US7443703B2Semiconductor deviceTOSHIBA KK·Filed 2005·Granted Oct 28, 2008·2 cites·16 claims
- 2760US8000923B2Semiconductor integrated circuitTOSHIBA KK·Filed 2008·Granted Aug 16, 2011·1 cites·11 claims
- 2860US7760537B2Programmable ROMTOSHIBA KK·Filed 2008·Granted Jul 20, 2010·4 cites·20 claims
- 2958US2024330668A1Analogue arithmetic unit and nuromorphic deviceTDK CORP·Filed 2023·Application pending·0 cites
- 3056US8018757B2Semiconductor memory device and trimming method thereofTOSHIBA KK·Filed 2009·Granted Sep 13, 2011·3 cites·20 claims
- 3155US2015003779A1Semiconductor integrated circuitTOSHIBA KK·Filed 2014·Application pending·0 cites
- 3254US5517454ASemiconductor memory device having refresh circuitsTOSHIBA KK·Filed 1994·Granted May 14, 1996·15 cites·4 claims
- 3354US5027009ASemiconductor logic circuit with a bipolar current mirror arrangementTOSHIBA KK·Filed 1989·Granted Jun 25, 1991·9 cites·27 claims
- 3453US6859070B2Semiconductor integrated circuit device having flip-flops that can be reset easilyTOSHIBA KK·Filed 2003·Granted Feb 22, 2005·6 cites·8 claims
- 3552US5991230ASynchronous random access memoryTOSHIBA KK·Filed 1998·Granted Nov 23, 1999·14 cites·12 claims
- 3650US6429687B1Semiconductor integrated circuit deviceTOSHIBA KK·Filed 2000·Granted Aug 6, 2002·5 cites·9 claims
- 3749US7466029B2Chip on chip device including basic chips capable of functioning independently from each other, and a system in package device including the chip on chip deviceTOSHIBA KK·Filed 2004·Granted Dec 16, 2008·4 cites·17 claims
- 3849US5331233ASense amplifier circuit for reducing transmission delay in data lineTOSHIBA KK·Filed 1992·Granted Jul 19, 1994·12 cites·19 claims
- 3948US8338964B2Stacked-chip deviceURAKAWA YUKIHIRO·Filed 2012·Granted Dec 25, 2012·0 cites·10 claims
- 4048US2010052111A1Stacked-chip deviceTOSHIBA KK·Filed 2009·Application pending·0 cites
- 4147US8077499B2Semiconductor integrated memory circuit and trimming method thereofKAWASUMI ATSUSHI·Filed 2009·Granted Dec 13, 2011·1 cites·19 claims
- 4246US5331225ABiCMOS logic circuit with bipolar transistor and MOS transistor formed on the same semiconductor substrateTOSHIBA KK·Filed 1992·Granted Jul 19, 1994·8 cites·5 claims
- 4346US2005197816A1Circuit simulation system with simulation models assigned based on layout information and connection informationTOSHIBA KK·Filed 2004·Application pending·0 cites
- 4446US2005155001A1Method for designing a semiconductor integrated circuit and a semiconductor integrated circuitTOSHIBA KK·Filed 2004·Application pending·0 cites
- 4543US2007213882A1Thermal Management systemINUKAI TAKASHI·Filed 2007·Application pending·0 cites
- 4641US2006248383A1Processing device on which processing elements having same function are embedded in one chipURAKAWA YUKIHIRO·Filed 2006·Application pending·0 cites
- 4735US5399894ASemiconductor device having bipolar transistor and MOS transistorTOSHIBA KK·Filed 1992·Granted Mar 21, 1995·4 cites·14 claims
- 4834US2003061555A1Semiconductor integrated circuitTOSHIBA KK·Filed 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →