Inventor · disambiguated record
Yuta Urano
Also filed as: URANO YUTA
80 granted patents·17 pending applications·427 citations·filing 2006–2024
99Inventor score
Top patents by PatentIndex Score
97 records- 0197US7664608B2Defect inspection method and apparatusHITACHI HIGH TECH CORP·Filed 2007·Granted Feb 16, 2010·37 cites·26 claims
- 0297US7528942B2Method and apparatus for detecting defectsHITACHI HIGH TECH CORP·Filed 2006·Granted May 5, 2009·32 cites·8 claims
- 0397US7465935B2Method for inspecting pattern defect and device for realizing the sameHITACHI HIGH TECH CORP·Filed 2006·Granted Dec 16, 2008·45 cites·8 claims
- 0497US7333192B2Apparatus and method for inspecting defectsHITACHI HIGH TECH CORP·Filed 2007·Granted Feb 19, 2008·37 cites·20 claims
- 0594US7777876B2Inspection method and inspection deviceHITACHI HIGH TECH CORP·Filed 2008·Granted Aug 17, 2010·27 cites·19 claims
- 0693US7859656B2Defect inspection method and systemHITACHI HIGH TECH CORP·Filed 2009·Granted Dec 28, 2010·15 cites·18 claims
- 0792US8922764B2Defect inspection method and defect inspection apparatusURANO YUTA·Filed 2011·Granted Dec 30, 2014·12 cites·12 claims
- 0892US8310665B2Inspecting method and inspecting apparatus for substrate surfaceHAMAMATSU AKIRA·Filed 2012·Granted Nov 13, 2012·9 cites·18 claims
- 0992US8144337B2Inspecting method and inspecting apparatus for substrate surfaceHAMAMATSU AKIRA·Filed 2009·Granted Mar 27, 2012·15 cites·15 claims
- 1091US10823686B2X-ray inspection method and X-ray inspection deviceHITACHI HIGH TECH SCIENCE CORP·Filed 2016·Granted Nov 3, 2020·5 cites·16 claims
- 1191US10663844B2Projection control apparatus and control method thereof, and projection systemCANON KK·Filed 2018·Granted May 26, 2020·7 cites·18 claims
- 1291US9568439B2Defect inspection device and defect inspection methodHITACHI HIGH TECH CORP·Filed 2016·Granted Feb 14, 2017·3 cites·16 claims
- 1391US7768635B2Apparatus and method for inspecting defectsHITACHI HIGH TECH CORP·Filed 2008·Granted Aug 3, 2010·10 cites·20 claims
- 1491US7492452B2Defect inspection method and systemHITACHI HIGH TECH CORP·Filed 2007·Granted Feb 17, 2009·13 cites·13 claims
- 1590US9678021B2Method and apparatus for inspecting defectsHITACHI HIGH TECH CORP·Filed 2015·Granted Jun 13, 2017·4 cites·10 claims
- 1690US8218138B2Apparatus and method for inspecting defectsNAKANO HIROYUKI·Filed 2011·Granted Jul 10, 2012·7 cites·11 claims
- 1790US7869024B2Method and its apparatus for inspecting defectsHITACHI HIGH TECH CORP·Filed 2009·Granted Jan 11, 2011·11 cites·13 claims
- 1889US9007581B2Inspection method and inspection deviceHORAI IZUO·Filed 2012·Granted Apr 14, 2015·13 cites·26 claims
- 1989US7675613B2Defect inspection methodHITACHI HIGH TECH CORP·Filed 2009·Granted Mar 9, 2010·9 cites·8 claims
- 2088US10401300B2Defect observation method and device and defect detection deviceHITACHI HIGH TECH CORP·Filed 2015·Granted Sep 3, 2019·4 cites·8 claims
- 2188US9645094B2Defect inspection device and defect inspection methodHITACHI HIGH TECH CORP·Filed 2016·Granted May 9, 2017·2 cites·4 claims
- 2287US9310318B2Defect inspection method and defect inspection deviceHITACHI HIGH TECH CORP·Filed 2015·Granted Apr 12, 2016·3 cites·10 claims
- 2387US8314929B2Method and its apparatus for inspecting defectsURANO YUTA·Filed 2011·Granted Nov 20, 2012·5 cites·6 claims
- 2487US8274652B2Defect inspection system and method of the sameURANO YUTA·Filed 2008·Granted Sep 25, 2012·11 cites·16 claims
- 2586US10830706B2Defect inspection apparatus and defect inspection methodHITACHI HIGH TECH CORP·Filed 2018·Granted Nov 10, 2020·2 cites·16 claims
- 2686US8599369B2Defect inspection device and inspection methodURANO YUTA·Filed 2010·Granted Dec 3, 2013·6 cites·15 claims
- 2786US8107065B2Method and apparatus for detecting defectsNAKANO HIROYUKI·Filed 2010·Granted Jan 31, 2012·4 cites·8 claims
- 2886US7916288B2Defect inspection methodHITACHI HIGH TECH CORP·Filed 2010·Granted Mar 29, 2011·4 cites·12 claims
- 2985US9329137B2Defect inspection method and device using sameHITACHI HIGH TECH CORP·Filed 2014·Granted May 3, 2016·4 cites·12 claims
- 3083US9733194B2Method for reviewing a defect and apparatusHITACHI HIGH TECH CORP·Filed 2015·Granted Aug 15, 2017·2 cites·15 claims
- 3183US9506876B2X-ray inspection device, inspection method, and X-ray detectorHITACHI HIGH TECH CORP·Filed 2012·Granted Nov 29, 2016·4 cites·12 claims
- 3283US8670116B2Method and device for inspecting for defectsNAKAO TOSHIYUKI·Filed 2011·Granted Mar 11, 2014·6 cites·16 claims
- 3381US10228332B2Defect inspection device and defect inspection methodHITACHI HIGH TECH CORP·Filed 2015·Granted Mar 12, 2019·2 cites·14 claims
- 3481US8804110B2Fault inspection device and fault inspection methodURANO YUTA·Filed 2011·Granted Aug 12, 2014·4 cites·8 claims
- 3581US8638429B2Defect inspecting method and defect inspecting apparatusNAKAO TOSHIYUKI·Filed 2009·Granted Jan 28, 2014·5 cites·16 claims
- 3681US7973920B2Apparatus and method for inspecting defectsHITACHI HIGH TECH CORP·Filed 2010·Granted Jul 5, 2011·3 cites·19 claims
- 3780US9523648B2Defect inspection device and defect inspection methodHITACHI HIGH TECH CORP·Filed 2013·Granted Dec 20, 2016·3 cites·8 claims
- 3880US8654350B2Inspecting method and inspecting apparatus for substrate surfaceHAMAMATSU AKIRA·Filed 2012·Granted Feb 18, 2014·2 cites·10 claims
- 3979US8514388B2Flaw inspecting method and device thereforMARUYAMA SHIGENOBU·Filed 2010·Granted Aug 20, 2013·5 cites·3 claims
- 4079US8482727B2Defect inspection methodNAKAO TOSHIYUKI·Filed 2012·Granted Jul 9, 2013·2 cites·13 claims
- 4179US8115915B2Defect inspection method and apparatusNAKAO TOSHIYUKI·Filed 2011·Granted Feb 14, 2012·2 cites·13 claims
- 4279US7965386B2Method and its apparatus for inspecting defectsHITACHI HIGH TECH CORP·Filed 2010·Granted Jun 21, 2011·2 cites·7 claims
- 4378US10254235B2Defect inspecting method and defect inspecting apparatusHITACHI HIGH TECH CORP·Filed 2017·Granted Apr 9, 2019·1 cites·5 claims
- 4478US8264679B2Inspection apparatusOSHIMA YOSHIMASA·Filed 2012·Granted Sep 11, 2012·2 cites·18 claims
- 4578US7751037B2Method and apparatus for detecting defectsHITACHI HIGH TECH CORP·Filed 2009·Granted Jul 6, 2010·3 cites·7 claims
- 4675US8477302B2Defect inspection apparatusURANO YUTA·Filed 2009·Granted Jul 2, 2013·4 cites·18 claims
- 4775US8427634B2Defect inspection method and apparatusURANO YUTA·Filed 2009·Granted Apr 23, 2013·3 cites·18 claims
- 4874US8711347B2Defect inspection method and device thereforHONDA TOSHIFUMI·Filed 2011·Granted Apr 29, 2014·2 cites·16 claims
- 4973US9773641B2Method and apparatus for observing defectsOTANI YUKO·Filed 2011·Granted Sep 26, 2017·3 cites·16 claims
- 5073US9109194B2Device for harvesting bacterial colony and method thereforHONDA TOSHIFUMI·Filed 2010·Granted Aug 18, 2015·2 cites·4 claims
Showing the top 50 of 97 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →