Inventor · disambiguated record
Yuji Wakamiya
Also filed as: WAKAMIYA YUJI
27 granted patents·9 pending applications·89 citations·filing 2008–2025
95Inventor score
Top patents by PatentIndex Score
36 records- 0193US9304140B2Sample analyzerWAKAMIYA YUJI·Filed 2011·Granted Apr 5, 2016·18 cites·15 claims
- 0282US8535607B2Sample analyzerWAKAMIYA YUJI·Filed 2008·Granted Sep 17, 2013·9 cites·9 claims
- 0380US10514376B2Position adjustment method for movable unit in sample analyzer, and sample analyzerSYSMEX CORP·Filed 2013·Granted Dec 24, 2019·4 cites·18 claims
- 0480US8430321B2Sample analyzer and reagent information writing methodTOKUNAGA KAZUTOSHI·Filed 2011·Granted Apr 30, 2013·5 cites·16 claims
- 0579US9151703B2Sample analyzer and a sample analyzing methodSYSMEX CORP·Filed 2013·Granted Oct 6, 2015·3 cites·7 claims
- 0677US9201083B2Sample analyzer and reagent management methodWAKAMIYA YUJI·Filed 2011·Granted Dec 1, 2015·3 cites·11 claims
- 0777US8329103B2Sample analyzer and method for analyzing samplesWAKAMIYA YUJI·Filed 2008·Granted Dec 11, 2012·10 cites·11 claims
- 0876US2025231207A1Method for controlling specimen analysis system and specimen analysis systemSYSMEX CORP·Filed 2025·Application pending·0 cites
- 0975US8231830B2Sample analyzerWAKAMIYA YUJI·Filed 2008·Granted Jul 31, 2012·8 cites·12 claims
- 1075US8040757B2Sample analyzing apparatusSYSMEX CORP·Filed 2008·Granted Oct 18, 2011·4 cites·17 claims
- 1174US12498386B2Method for controlling specimen analysis system and specimen analysis systemSYSMEX CORP·Filed 2022·Granted Dec 16, 2025·0 cites·13 claims
- 1273US9915594B2Sample analyzer and a sample analyzing methodSYSMEX CORP·Filed 2015·Granted Mar 13, 2018·1 cites·20 claims
- 1372US8871147B2Sample analyzer and storage mediumWAKAMIYA YUJI·Filed 2012·Granted Oct 28, 2014·2 cites·12 claims
- 1470US8778268B2Specimen analyzer, abnormality control method of the same and computer program productTAKEHARA HISATO·Filed 2008·Granted Jul 15, 2014·8 cites·5 claims
- 1570US8071029B2Sample analyzer and sample analyzing methodWAKAMIYA YUJI·Filed 2008·Granted Dec 6, 2011·3 cites·12 claims
- 1670US7707010B2Sample analyzer and error information displaying methodSYSMEX CORP·Filed 2008·Granted Apr 27, 2010·4 cites·13 claims
- 1768US2025208157A1Method of transporting rack and sample measurement systemSYSMEX CORP·Filed 2025·Application pending·0 cites
- 1867US8425839B2Sample analyzerWAKAMIYA YUJI·Filed 2008·Granted Apr 23, 2013·2 cites·19 claims
- 1967US8335662B2Sample analyzer and error information displaying methodWAKAMIYA YUJI·Filed 2010·Granted Dec 18, 2012·2 cites·6 claims
- 2067US7957935B2Analyzer and method of restarting sample measurementSYSMEX CORP·Filed 2008·Granted Jun 7, 2011·2 cites·20 claims
- 2162US12306200B2Method of transporting rack and sample measurement systemSYSMEX CORP·Filed 2020·Granted May 20, 2025·0 cites·7 claims
- 2259US9606133B2Specimen analyzer and specimen analyzing methodWAKAMIYA YUJI·Filed 2011·Granted Mar 28, 2017·1 cites·16 claims
- 2358US10302666B2Specimen analyzer and specimen analyzing methodSYSMEX CORP·Filed 2017·Granted May 28, 2019·0 cites·17 claims
- 2456US11953511B2Sample measurement system and method of transporting racksSYSMEX CORP·Filed 2020·Granted Apr 9, 2024·0 cites·19 claims
- 2556US11531037B2Display device, sample measurement system, display method and programSYSMEX CORP·Filed 2020·Granted Dec 20, 2022·0 cites·20 claims
- 2656US2021018526A1Sample analysis system, cleaning liquid preparation apparatus, sample analyzer, and cleaning liquid supply methodSYSMEX CORP·Filed 2020·Application pending·0 cites
- 2754US8279715B2Sample analyzing apparatusWAKAMIYA YUJI·Filed 2011·Granted Oct 2, 2012·0 cites·17 claims
- 2851US2020408793A1Testing system, storage device, and rack storage methodSYSMEX CORP·Filed 2020·Application pending·0 cites
- 2949US2009220379A1Analyzer and measurement restarting methodSYSMEX CORP·Filed 2008·Application pending·0 cites
- 3048US10830783B2Sample analysis system, cleaning liquid preparation apparatus, sample analyzer, and cleaning liquid supply methodSYSMEX CORP·Filed 2016·Granted Nov 10, 2020·0 cites·13 claims
- 3148US2021011040A1Sample measurement system and method of transporting racksSYSMEX CORP·Filed 2020·Application pending·0 cites
- 3247US2014295562A1Sample analyzer and method for loading reagent containerSYSMEX CORP·Filed 2013·Application pending·0 cites
- 3345US9581608B2Sample analyzer and method for controlling sample analyzerSYSMEX CORP·Filed 2012·Granted Feb 28, 2017·0 cites·16 claims
- 3445US2009074616A1Specimen analyzer and liquid suction assemblySYSMEX CORP·Filed 2008·Application pending·0 cites
- 3543US2013034466A1Sample analyzerWAKAMIYA YUJI·Filed 2012·Application pending·0 cites
- 3642US8366998B2Sample analyzer and sample analyzing methodSYSMEX CORP·Filed 2008·Granted Feb 5, 2013·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →