Inventor · disambiguated record
Yu Wang
Also filed as: WANG YU · Wang yu-fu
13 granted patents·7 pending applications·40 citations·filing 2005–2025
89Inventor score
Files withALPHA & OMEGA SEMICONDUCTOR9UNITED MICROELECTRONICS CORP5TAIWAN SEMICONDUCTOR MFG CO LTD3WANG YU2LOU YINGYING1
Top patents by PatentIndex Score
20 records- 0183US8053315B2Method to manufacture split gate with high density plasma oxide layer as inter-polysilicon insulation layerALPHA & OMEGA SEMICONDUCTOR·Filed 2009·Granted Nov 8, 2011·10 cites·10 claims
- 0280US7795108B2Resistance-based etch depth determination for SGT technologyALPHA & OMEGA SEMICONDUCTOR·Filed 2009·Granted Sep 14, 2010·6 cites·5 claims
- 0380US7521332B2Resistance-based etch depth determination for SGT technologyALPHA & OMEGA SEMICONDUCTOR·Filed 2007·Granted Apr 21, 2009·6 cites·12 claims
- 0480US2025364249A1Method of manufacturing a semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0577US7932148B2Processes for manufacturing MOSFET devices with excessive round-hole shielded gate trench (SGT)ALPHA & OMEGA SEMICONDUCTOR·Filed 2009·Granted Apr 26, 2011·6 cites·10 claims
- 0676US7492005B2Excessive round-hole shielded gate trench (SGT) MOSFET devices and manufacturing processesALPHA & OMEGA SEMICONDUCTOR·Filed 2005·Granted Feb 17, 2009·6 cites·7 claims
- 0774US2024332086A1Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2024·Application pending·0 cites
- 0874US2024332087A1Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2024·Application pending·0 cites
- 0972US7928507B2Polysilicon control etch-back indicatorALPHA & OMEGA SEMICONDUCTOR·Filed 2009·Granted Apr 19, 2011·2 cites·8 claims
- 1072US2024395549A1Method of manufacturing semiconductor devices and semiconductor devicesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1170US7632733B2Polysilicon control etch-back indicatorALPHA & OMEGA SEMICONDUCTOR·Filed 2006·Granted Dec 15, 2009·2 cites·10 claims
- 1268US12494366B2Method of manufacturing semiconductor devices and semiconductor devicesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Dec 9, 2025·0 cites·20 claims
- 1368US12040234B2Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2021·Granted Jul 16, 2024·0 cites·8 claims
- 1467US8021563B2Etch depth determination for SGT technologyALPHA & OMEGA SEMICONDUCTOR·Filed 2007·Granted Sep 20, 2011·2 cites·19 claims
- 1558US2025212426A1Metal-insulator-metal capacitor structureUNITED MICROELECTRONICS CORP·Filed 2024·Application pending·0 cites
- 1657US2025240985A1Semiconductor structure with a deep trench capacitor structures and forming method thereofUNITED MICROELECTRONICS CORP·Filed 2024·Application pending·0 cites
- 1755US8471368B2Polysilicon control etch back indicatorWANG YU·Filed 2012·Granted Jun 25, 2013·0 cites·4 claims
- 1853US8193061B2Polysilicon control etch-back indicatorWANG YU·Filed 2011·Granted Jun 5, 2012·0 cites·6 claims
- 1945US2008150013A1Split gate formation with high density plasma (HDP) oxide layer as inter-polysilicon insulation layerALPHA & OMEGA SEMICONDUCTOR·Filed 2006·Application pending·0 cites
- 2044US8884406B2Etch depth determination structureLOU YINGYING·Filed 2011·Granted Nov 11, 2014·0 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →