Inventor · disambiguated record
Yun- Ling Yeh
Also filed as: YEH YUN- LING
0 granted patents·2 pending applications·0 citations·filing 2022–2023
Files withASML NETHERLANDS BV2
Top patents by PatentIndex Score
2 records- 0154US2025003899A1Method and system of image analysis and critical dimension matching for charged-particle inspection apparatusASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 0252US2025336046A1System and method for distortion adjustment during inspectionASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →