Inventor · disambiguated record
Zhonghua Dong
Also filed as: DONG ZHONGHUA
24 granted patents·7 pending applications·79 citations·filing 2007–2025
93Inventor score
Files withASML NETHERLANDS BV19GUANGDONG MARSHELL ELECTRIC VEHICLE CO LTD4BRIGHTEST TECH TAIWAN CO LTD2HERMES MICROVISION INC2GUANGDONG MARXON ELECTRONICS CO LTD1
Top patents by PatentIndex Score
31 records- 0190US11508547B2Semiconductor charged particle detector for microscopyASML NETHERLANDS BV·Filed 2019·Granted Nov 22, 2022·4 cites·20 claims
- 0289US7705298B2System and method to determine focus parameters during an electron beam inspectionHERMES MICROVISION INC TAIWAN·Filed 2007·Granted Apr 27, 2010·20 cites·10 claims
- 0387US11295930B2Method and apparatus for charged particle detectionASML NETHERLANDS BV·Filed 2018·Granted Apr 5, 2022·3 cites·15 claims
- 0486USD1036300SGolf cartGUANGDONG MARSHELL ELECTRIC VEHICLE CO LTD·Filed 2023·Granted Jul 23, 2024·9 cites·1 claims
- 0586USD987556SPower stationGUANGDONG MARSHELL ELECTRIC VEHICLE CO LTD·Filed 2020·Granted May 30, 2023·11 cites·1 claims
- 0682US11594395B2Pixel shape and section shape selection for large active area high speed detectorASML NETHERLANDS BV·Filed 2019·Granted Feb 28, 2023·1 cites·20 claims
- 0782US2025182999A1Semiconductor charged particle detector for microscopyASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 0881US11476085B2Switch matrix design for beam image systemASML NETHERLANDS BV·Filed 2018·Granted Oct 18, 2022·2 cites·20 claims
- 0981US9330987B2Hot spot identification, inspection, and reviewHERMES MICROVISION INC·Filed 2014·Granted May 3, 2016·5 cites·25 claims
- 1077US12205792B2Semiconductor charged particle detector for microscopyASML NETHERLANDS BV·Filed 2022·Granted Jan 21, 2025·0 cites·17 claims
- 1177US11715619B2Method and apparatus for charged particle detectionASML NETHERLANDS BV·Filed 2022·Granted Aug 1, 2023·0 cites·20 claims
- 1277US2025006456A1Cross-talk cancellation in multiple charged-particle beam inspectionASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 1376US2024044820A1Methods of inspecting samples with a beam of charged particlesASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 1475US11862427B2Switch matrix design for beam image systemASML NETHERLANDS BV·Filed 2022·Granted Jan 2, 2024·0 cites·20 claims
- 1574US11942304B2Field programmable detector arrayASML NETHERLANDS BV·Filed 2022·Granted Mar 26, 2024·0 cites·20 claims
- 1673USD802530SPortable power supplyHUNTKEY USA INC·Filed 2016·Granted Nov 14, 2017·19 cites·1 claims
- 1767USD1036301SGolf cartGUANGDONG MARSHELL ELECTRIC VEHICLE CO LTD·Filed 2023·Granted Jul 23, 2024·3 cites·1 claims
- 1867US11815473B2Methods of inspecting samples with multiple beams of charged particlesASML NETHERLANDS BV·Filed 2020·Granted Nov 14, 2023·0 cites·20 claims
- 1965US12080513B2Cross-talk cancellation in multiple charged-particle beam inspectionASML NETHERLANDS BV·Filed 2020·Granted Sep 3, 2024·0 cites·15 claims
- 2065US11430629B2Field programmable detector arrayASML NETHERLANDS BV·Filed 2018·Granted Aug 30, 2022·0 cites·16 claims
- 2158US12505974B2Systems and methods for focusing charged—particle beamsASML NETHERLANDS BV·Filed 2019·Granted Dec 23, 2025·0 cites·16 claims
- 2258US2025166955A1Beam manipulation using charge regulator in a charged particle systemASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 2357USD1088956SGolf cartGUANGDONG MARSHELL ELECTRIC VEHICLE CO LTD·Filed 2023·Granted Aug 19, 2025·1 cites·1 claims
- 2454US12381064B2Architecture for large active area high speed detectorASML NETHERLANDS BV·Filed 2019·Granted Aug 5, 2025·0 cites·15 claims
- 2550US8519333B2Charged particle system for reticle/wafer defects inspection and reviewKUAN CHIYAN·Filed 2012·Granted Aug 27, 2013·0 cites·22 claims
- 2649US2023116381A1System and method for high throughput defect inspection in a charged particle systemASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
- 2749US2025290868A1Optical inspection systemBRIGHTEST TECH TAIWAN CO LTD·Filed 2025·Application pending·0 cites
- 2848US11175248B2Apparatus and method for detecting time-dependent defects in a fast-charging deviceASML NETHERLANDS BV·Filed 2019·Granted Nov 16, 2021·0 cites·15 claims
- 2946USD1067178SPortable power stationGUANGDONG MARXON ELECTRONICS CO LTD·Filed 2022·Granted Mar 18, 2025·1 cites·1 claims
- 3043US2025245814A1Inspection apparatus and operation method of the sameBRIGHTEST TECH TAIWAN CO LTD·Filed 2024·Application pending·0 cites
- 3142US9601311B2Laser SDE effect compensation by adaptive tuningHERMES MICROVISION INC·Filed 2016·Granted Mar 21, 2017·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →