Inventor · disambiguated record
Zhengping Yao
Also filed as: YAO ZHENGPING
5 granted patents·5 pending applications·1 citations·filing 2018–2025
63Inventor score
Files withAPPLIED MATERIALS INC10
Top patents by PatentIndex Score
10 records- 0182US12353009B2Total or local thickness variation for optical devicesAPPLIED MATERIALS INC·Filed 2024·Granted Jul 8, 2025·0 cites·20 claims
- 0279US12510707B2Total or local thickness variation for optical devicesAPPLIED MATERIALS INC·Filed 2023·Granted Dec 30, 2025·0 cites·20 claims
- 0376US11331855B2Additive manufacturing with dithering scan pathAPPLIED MATERIALS INC·Filed 2018·Granted May 17, 2022·1 cites·18 claims
- 0464US2023123795A1Singulation of optical devices from optical device substrates via laser ablationAPPLIED MATERIALS INC·Filed 2022·Application pending·0 cites
- 0562US12208637B2Patterning of optical device films via inkjet soluble mask, deposition, and lift-offAPPLIED MATERIALS INC·Filed 2023·Granted Jan 28, 2025·0 cites·20 claims
- 0658US2025284140A1Substrate-level monolithic integration of prescription lens with augmented reality (ar) waveguidesAPPLIED MATERIALS INC·Filed 2025·Application pending·0 cites
- 0757US2025341677A1Low frequency imprint for grayscale optical device fabricationAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 0856US2024142690A1Inkjet gradient index material to modulate grating diffraction efficiencyAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 0946US11901203B2Substrate process endpoint detection using machine learningAPPLIED MATERIALS INC·Filed 2021·Granted Feb 13, 2024·0 cites·20 claims
- 1041US2022397515A1Obtaining substrate metrology measurement values using machine learningAPPLIED MATERIALS INC·Filed 2021·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →