Inventor · disambiguated record
Zhaozhao Zhu
Also filed as: ZHU ZHAOZHAO
22 granted patents·11 pending applications·24 citations·filing 2020–2025
91Inventor score
Files withAPPLIED MATERIALS INC33
Top patents by PatentIndex Score
33 records- 0195US12283503B2Substrate measurement subsystemAPPLIED MATERIALS INC·Filed 2021·Granted Apr 22, 2025·3 cites·20 claims
- 0293US11668602B2Spatial optical emission spectroscopy for etch uniformityAPPLIED MATERIALS INC·Filed 2021·Granted Jun 6, 2023·2 cites·18 claims
- 0385US12442765B2Transmission corrected plasma emission using in-situ optical reflectometryAPPLIED MATERIALS INC·Filed 2024·Granted Oct 14, 2025·0 cites·20 claims
- 0483USD977504SPortion of a display panel with a graphical user interfaceAPPLIED MATERIALS INC·Filed 2020·Granted Feb 7, 2023·10 cites·1 claims
- 0580US12405164B2Spatial optical emission spectroscopy for etch uniformityAPPLIED MATERIALS INC·Filed 2023·Granted Sep 2, 2025·0 cites·20 claims
- 0676USD1045924SPortion of a display panel with a graphical user interfaceAPPLIED MATERIALS INC·Filed 2024·Granted Oct 8, 2024·4 cites·1 claims
- 0776USD1031743SPortion of a display panel with a graphical user interfaceAPPLIED MATERIALS INC·Filed 2022·Granted Jun 18, 2024·5 cites·1 claims
- 0876US2025291335A1Estimation of chamber component conditions using substrate measurementsAPPLIED MATERIALS INC·Filed 2025·Application pending·0 cites
- 0973US12031910B2Transmission corrected plasma emission using in-situ optical reflectometryAPPLIED MATERIALS INC·Filed 2021·Granted Jul 9, 2024·0 cites·21 claims
- 1072US12191176B2Integrated substrate measurement system to improve manufacturing process performanceAPPLIED MATERIALS INC·Filed 2023·Granted Jan 7, 2025·0 cites·16 claims
- 1172US2024290592A1Thin film, in-situ measurement through transparent crystal and transparent substrate within processing chamber wallAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 1272US2024339347A1Integrated substrate measurement systemAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 1371US2024096715A1In-situ etch material selectivity detection systemAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 1470US11927543B2Multiple reflectometry for measuring etch parametersAPPLIED MATERIALS INC·Filed 2023·Granted Mar 12, 2024·0 cites·20 claims
- 1570US2025218829A1Substrate measurement subsystemAPPLIED MATERIALS INC·Filed 2025·Application pending·0 cites
- 1669US12339645B2Estimation of chamber component conditions using substrate measurementsAPPLIED MATERIALS INC·Filed 2022·Granted Jun 24, 2025·0 cites·24 claims
- 1767US2025391006A1Implementing features generated using discrete effective medium refractive analysis of patterned substratesAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 1864US12148647B2Integrated substrate measurement systemAPPLIED MATERIALS INC·Filed 2022·Granted Nov 19, 2024·0 cites·18 claims
- 1964US11830779B2In-situ etch material selectivity detection systemAPPLIED MATERIALS INC·Filed 2021·Granted Nov 28, 2023·0 cites·13 claims
- 2063US11688616B2Integrated substrate measurement system to improve manufacturing process performanceAPPLIED MATERIALS INC·Filed 2021·Granted Jun 27, 2023·0 cites·10 claims
- 2163US11619594B2Multiple reflectometry for measuring etch parametersAPPLIED MATERIALS INC·Filed 2021·Granted Apr 4, 2023·0 cites·19 claims
- 2260US12449379B2Machine learning model trainingAPPLIED MATERIALS INC·Filed 2023·Granted Oct 21, 2025·0 cites·20 claims
- 2360US12009191B2Thin film, in-situ measurement through transparent crystal and transparent substrate within processing chamber wallAPPLIED MATERIALS INC·Filed 2020·Granted Jun 11, 2024·0 cites·19 claims
- 2459US2025244122A1Multi-purpose confocal sensor systemsAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 2559US2024128100A1Methods and systems for a spectral library at a manufacturing systemAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 2659US2023062206A1Determining substrate profile properties using machine learningAPPLIED MATERIALS INC·Filed 2022·Application pending·0 cites
- 2758US12469686B2Process characterization and correction using optical wall process sensor (OWPS)APPLIED MATERIALS INC·Filed 2022·Granted Nov 11, 2025·0 cites·20 claims
- 2857US12216455B2Chamber component condition estimation using substrate measurementsAPPLIED MATERIALS INC·Filed 2022·Granted Feb 4, 2025·0 cites·20 claims
- 2955US12467136B2Process characterization and correction using optical wall process sensor (OWPS)APPLIED MATERIALS INC·Filed 2022·Granted Nov 11, 2025·0 cites·19 claims
- 3053US2022026817A1Determining substrate profile properties using machine learningAPPLIED MATERIALS INC·Filed 2021·Application pending·0 cites
- 3150US12489022B2In-situ etch rate and etch rate uniformity detection systemAPPLIED MATERIALS INC·Filed 2021·Granted Dec 2, 2025·0 cites·17 claims
- 3249US2022066411A1Detecting and correcting substrate process drift using machine learningAPPLIED MATERIALS INC·Filed 2021·Application pending·0 cites
- 3344USD1045923SPortion of a display panel with a graphical user interfaceAPPLIED MATERIALS INC·Filed 2024·Granted Oct 8, 2024·0 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →