Inventor · disambiguated record
Zizhou Gong
Also filed as: GONG ZIZHOU
1 granted patent·3 pending applications·3 citations·filing 2020–2023
22Inventor score
Files withASML NETHERLANDS BV4
Top patents by PatentIndex Score
4 records- 0192US12211669B2Multiple charged-particle beam apparatus with low crosstalkASML NETHERLANDS BV·Filed 2020·Granted Jan 28, 2025·3 cites·17 claims
- 0254US2025336636A1Method and system for fine focusing secondary beam spots on detector for multi-beam inspection apparatusASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 0349US2025232941A1Wafer edge inspection of charged particle inspection systemASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 0448US2024420916A1Wafer edge inspection of charged particle inspection systemASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →