Inventor · name-matched record
CHAWLA NITIN
1 granted patent·7 pending applications·0 citations·filing 2023–2025
1Inventor score
Files withST MICROELECTRONICS INT NV8
This identity is grouped by exact name match (no disambiguated inventor record was available for these filings) — it may combine same-named inventors.
Top patents by PatentIndex Score
8 records- 0183US2026065976A1Enhanced accuracy of bit line reading for an in-memory compute operation by accounting for variation in read currentST MICROELECTRONICS INT NV·Filed 2025·Application pending·0 cites
- 0283US2026065975A1Bit line read current mirroring circuit for an in-memory compute operation where simultaneous access is made to plural rows of a static random access memory (sram)ST MICROELECTRONICS INT NV·Filed 2025·Application pending·0 cites
- 0380US2026018228A1At-speed transition fault testing for a multi-port and multi-clock memoryST MICROELECTRONICS INT NV·Filed 2025·Application pending·0 cites
- 0463US2026086976A1Shared communications resource in a multi-tile in-memory computation (imc) neural processing unit (npu)ST MICROELECTRONICS INT NV·Filed 2025·Application pending·0 cites
- 0563US2026031140A1Randomized sequence for row and/or column addressing in a digital in-memory computation processing systemST MICROELECTRONICS INT NV·Filed 2025·Application pending·0 cites
- 0662US2026050412A1Dynamic bit precision control for an in-memory computation processing systemST MICROELECTRONICS INT NV·Filed 2025·Application pending·0 cites
- 0758US2026031139A1Memory architecture with a digital in-memory computation processing mode and a column multiplexing memory access modeST MICROELECTRONICS INT NV·Filed 2025·Application pending·0 cites
- 0845US12584961B2Built-in self test circuit for segmented static random access memory (SRAM) array input/outputST MICROELECTRONICS INT NV·Filed 2023·Granted Mar 24, 2026·0 cites·19 claims
Join the waitlist — get patent alerts
Get an alert when CHAWLA NITIN files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: exact name match across USPTO filings. How scoring works →