Inventor · name-matched record
LIN CHIN-YI
0 granted patents·3 pending applications·0 citations·filing 2025–2025
Technology areasG01R
Files withMPI CORP3
This identity is grouped by exact name match (no disambiguated inventor record was available for these filings) — it may combine same-named inventors.
Top patents by PatentIndex Score
3 records- 0183US2026063669A1Probe unit, probe head, probe card, probe system, method of performing a test on an electronic device under test, and tested electronic deviceMPI CORP·Filed 2025·Application pending·0 cites
- 0280US2026092952A1Probe system, probe card, probe head, and probe for testing electronic device under test integrated on a semiconductor wafer, and electronic device tested by the probe cardMPI CORP·Filed 2025·Application pending·0 cites
- 0376US2026056235A1Contact probe for probe head of probe card in apparatus for testing electronic device, probe head, probe card, tested device, and method of manufacturing contact probeMPI CORP·Filed 2025·Application pending·0 cites
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Identity basis: exact name match across USPTO filings. How scoring works →