Inventor · name-matched record
SINGH BHUPENDER
1 granted patent·1 pending application·0 citations·filing 2023–2025
1Inventor score
Technology areasG11C
Files withST MICROELECTRONICS INT NV2
This identity is grouped by exact name match (no disambiguated inventor record was available for these filings) — it may combine same-named inventors.
Top patents by PatentIndex Score
2 records- 0180US2026018228A1At-speed transition fault testing for a multi-port and multi-clock memoryST MICROELECTRONICS INT NV·Filed 2025·Application pending·0 cites
- 0245US12584961B2Built-in self test circuit for segmented static random access memory (SRAM) array input/outputST MICROELECTRONICS INT NV·Filed 2023·Granted Mar 24, 2026·0 cites·19 claims
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Identity basis: exact name match across USPTO filings. How scoring works →