Inventor · name-matched record
YACOBY RAN
2 granted patents·5 pending applications·0 citations·filing 2020–2024
22Inventor score
Files withAPPLIED MATERIALS ISRAEL LTD5ICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH1NOVA LTD1
This identity is grouped by exact name match (no disambiguated inventor record was available for these filings) — it may combine same-named inventors.
Top patents by PatentIndex Score
7 records- 0154US2026051029A1Method of determining aberrations of a charged particle beam, method of determining cd information, corresponding generation of computational models, and corresponding systemsICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2024·Application pending·0 cites
- 0251US2026087612A1Machine learning based generation of synthetic fault images of semiconductor specimensAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 0350US12573024B2Image augmentation for machine learning based defect examinationAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted Mar 10, 2026·0 cites·20 claims
- 0450US2026082866A1Augmented chemical mechanical planarizationAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 0550US2026094310A1Generation of synthetic fault images of semiconductor specimensAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 0649US2026024186A1Methods and systems enabling determination of a depth profile of a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 0745US12547082B2Combining physical modeling and machine learningNOVA LTD·Filed 2020·Granted Feb 10, 2026·0 cites·14 claims
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Identity basis: exact name match across USPTO filings. How scoring works →