US11225409B2ActiveUtilityPatentIndex 71
Sensor with integrated heater
Est. expirySep 17, 2038(~12.2 yrs left)· nominal 20-yr term from priority
B81B 2203/0127B81C 99/0045B81B 2201/0264B81B 2203/04B81B 7/0029B81B 7/0087
71
PatentIndex Score
2
Cited by
222
References
17
Claims
Abstract
A device includes a microelectromechanical system (MEMS) sensor die comprising a deformable membrane, a MEMS heating element, and a substrate. The MEMS heating element is integrated within a same layer and a same plane as the deformable membrane. The MEMS heating element surrounds the deformable membrane and is separated from the deformable membrane through a trench. The MEMS heating element is configured to generate heat to heat up the deformable membrane. The substrate is coupled to the deformable membrane.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1. A device comprising:
a microelectromechanical system (MEMS) sensor die comprising:
a deformable membrane;
a MEMS heating element integrated within a same layer and a same plane as the deformable membrane;
wherein the MEMS heating element is disposed on the outer periphery of the deformable membrane;
wherein the MEMS heating element is electrically isolated from the deformable membrane by a trench;
wherein the MEMS heating element is configured to generate heat to heat up the deformable membrane.
2. The device of claim 1 , wherein the trench is within a silicon layer.
3. The device of claim 1 , wherein a material within the trench is selected from a group consisting of Silicon Nitride and Silicon Oxide.
4. The device of claim 1 further comprising another trench, wherein the another trench is positioned on an outer periphery of the MEMS heating element configured to electrically isolate the MEMS heating element from a peripheral layer.
5. The device of claim 1 , wherein a periphery of the deformable membrane is positioned on an oxide layer, and wherein the deformable membrane, the oxide layer, and the substrate form a cavity, and wherein the substrate includes an electrode that is formed on a top surface of the substrate that faces the deformable membrane within the cavity.
6. The device of claim 5 , wherein the MEMS heating element is disposed on the oxide layer.
7. The device of claim 1 , wherein the MEMS heating element is configured to generate heat for calibration responsive to temperature coefficient of offset (TCO).
8. The device of claim 7 , wherein the calibration is performed in response to a trigger.
9. The device of claim 1 , wherein the MEMS heating element is configured to generate heat responsive to detecting presence of liquid on the deformable membrane.
10. A device comprising a microelectromechanical system (MEMS) sensor die comprising:
a deformable membrane;
a MEMS heating element integrated within a same layer and a same plane as the deformable membrane,
wherein the MEMS heating element is disposed on a periphery of the deformable membrane and is configured to generate thermal energy to heat up the deformable membrane, and wherein the MEMS heating element has a gap therein, wherein the MEMS heating element surrounds the membrane without fully encompassing the deformable membrane; and
a substrate.
11. The device of claim 10 further comprising another MEMS heating element integrated within the same layer and the same plane as the deformable membrane, wherein the MEMS heating element and the another MEMS heating element are separated from one another, and wherein the another MEMS heating element is positioned on the periphery of the deformable membrane and is configured to generate thermal energy to heat up the deformable membrane.
12. The device of claim 10 further comprising a trench disposed in between the MEMS heating element and the deformable membrane, and wherein the trench comprises a material within the trench is selected from a group consisting of Silicon Nitride and Silicon Oxide.
13. The device of claim 10 , wherein a periphery of the deformable membrane is disposed on an oxide layer, and wherein the deformable membrane, the oxide layer, and the substrate form a cavity, and wherein the substrate includes an electrode that is formed on a top surface of the substrate that faces the deformable membrane within the cavity, and wherein the MEMS heating element is disposed on the oxide layer.
14. The device of claim 10 , wherein the deformable membrane is formed from a peripheral layer.
15. The device of claim 10 , wherein the MEMS heating element is configured to generate heat for calibration responsive to temperature coefficient of offset (TCO) after the MEMS sensor die is soldered on a board.
16. The device of claim 10 , wherein the MEMS heating element is configured to generate heat responsive to detecting presence of liquid on the deformable membrane.
17. A device comprising a microelectromechanical system (MEMS) sensor die comprising:
a deformable membrane;
a MEMS heating element integrated within a same layer and a same plane as the deformable membrane,
wherein the MEMS heating element is disposed on a periphery of the deformable membrane and is configured to generate thermal energy to heat up the deformable membrane; and
a substrate,
wherein a trench is disposed in between the MEMS heating element and the deformable membrane, and wherein the trench comprises a material within the trench is selected from a group consisting of Silicon Nitride and Silicon Oxide.Cited by (0)
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