On-chip memory diagnostics

Abstract

An on-chip memory diagnostic (OCMD) circuit may instruct a set of built-in self-test (BIST) engines to execute BIST on memories associated with the set of BIST engines. Next, results of executing BIST on the memories may be received from the set of BIST engines. A set of memory failures may then be identified in the memories based on the results. Next, one or more BIST engines in the set of BIST engines may be instructed to collect diagnostic data for each memory failure. A set of diagnostic data may then be received for the set of memory failures. Next, the set of diagnostic data may be stored in an on-chip data container. The set of diagnostic data may then be provided via a communication channel.

What is claimed is: 
     
       1. A method, comprising:
 instructing, by an on-chip memory diagnostic circuit, a set of built-in self-test (BIST) engines to execute BIST on memories associated with the set of BIST engines; 
 receiving results of executing BIST on the memories from the set of BIST engines, wherein the set of BIST engines execute BIST on the memories until BIST is complete; 
 identifying a set of memory failures in the memories based on the results; 
 instructing one or more BIST engines in the set of BIST engines to collect diagnostic data for each memory failure in the memories; 
 receiving a set of diagnostic data for the set of memory failures; 
 storing the set of diagnostic data in an on-chip data container; and 
 providing the set of diagnostic data via a communication channel. 
 
     
     
       2. The method of  claim 1 , wherein the storing the set of diagnostic data in the on-chip data container comprises compressing the set of diagnostic data. 
     
     
       3. The method of  claim 1 , wherein the storing the set of diagnostic data in the on-chip data container comprises de-duplicating the set of diagnostic data. 
     
     
       4. The method of  claim 1 , wherein the storing the set of diagnostic data in the on-chip data container comprises truncating each diagnostic data in the set of diagnostic data in response to determining that the diagnostic data exceeds a size limit. 
     
     
       5. The method of  claim 1 , wherein the identifying the set of memory failures comprises identifying up to an upper limit of memory failures. 
     
     
       6. The method of  claim 1 , wherein the communication channel is a direct memory access (DMA) interface. 
     
     
       7. The method of  claim 1 , wherein the method is performed during a high temperature operating life (HTOL) test. 
     
     
       8. An integrated circuit (IC), comprising:
 a set of built-in self-test (BIST) engines to execute BIST on memories associated with the set of BIST engines; and 
 an on-chip memory diagnostic (OCMD) circuit to:
 instruct the set of BIST engines to begin execution of BIST on memories associated with the set of BIST engines; 
 receive results of executing BIST on the memories from the set of BIST engines; 
 identify a set of memory failures in the memories based on the results; 
 instruct one or more BIST engines in the set of BIST engines to collect diagnostic data for each memory failure in the memories, wherein the diagnostic data includes at least a column address and a row address associated with each memory failure; 
 receive a set of diagnostic data for the set of memory failures; 
 store the set of diagnostic data in a data container in the IC; and 
 provide the set of diagnostic data via a communication channel. 
 
 
     
     
       9. The IC of  claim 8 , wherein the OCMD circuit compresses the set of diagnostic data. 
     
     
       10. The IC of  claim 8 , wherein the OCMD circuit de-duplicates the set of diagnostic data. 
     
     
       11. The IC of  claim 8 , wherein the OCMD circuit truncates each diagnostic data in the set of diagnostic data in response to determining that the diagnostic data exceeds a size limit. 
     
     
       12. The IC of  claim 8 , wherein the OCMD circuit identifies up to an upper limit of memory failures. 
     
     
       13. The IC of  claim 8 , wherein the communication channel is a direct memory access (DMA) interface. 
     
     
       14. The IC of  claim 8 , wherein the OCMD circuit asserts a data ready signal when the set of diagnostic data are ready to be retrieved from the on-chip data container. 
     
     
       15. An apparatus, comprising:
 a tester; and 
 an integrated circuit (IC), comprising:
 a set of built-in self-test (BIST) engines to execute BIST on memories associated with the set of BIST engines; and 
 an on-chip memory diagnostic (OCMD) circuit to:
 instruct the set of BIST engines to begin execution of BIST on memories associated with the set of BIST engines; 
 receive results of executing BIST on the memories from the set of BIST engines; 
 identify a set of memory failures in the memories based on the results; 
 instruct one or more BIST engines in the set of BIST engines to collect diagnostic data for each memory failure in the memories, wherein the diagnostic data includes at least a column address and a row address associated with each memory failure; 
 receive a set of diagnostic data for the set of memory failures; 
 store the set of diagnostic data in a data container in the IC; and 
 provide the set of diagnostic data to the tester via a communication channel. 
 
 
 
     
     
       16. The apparatus of  claim 15 , wherein the OCMD circuit compresses the set of diagnostic data. 
     
     
       17. The apparatus of  claim 15 , wherein the OCMD circuit de-duplicates the set of diagnostic data. 
     
     
       18. The apparatus of  claim 15 , wherein the OCMD circuit truncates each diagnostic data in the set of diagnostic data in response to determining that the diagnostic data exceeds a size limit. 
     
     
       19. The apparatus of  claim 15 , wherein the OCMD circuit identifies up to an upper limit of memory failures. 
     
     
       20. The apparatus of  claim 15 , wherein the communication channel is a direct memory access (DMA) interface, and wherein the tester retrieves data stored in the on-chip data container via the DMA interface in response to the OCMD circuit asserting a data ready signal.