US2002061715A1PendingUtilityA1
Modified plating solution for plating and planarization and process utilizing same
Est. expiryFeb 11, 2020(expired)· nominal 20-yr term from priority
H10P 52/403H10P 14/47H10W 20/4421H10W 20/062H10W 20/056C25D 7/123B24B 37/042C25D 3/38
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Claims
Abstract
A modified plating solution that can be used to electroplate a high quality conductive material that can be effectively polished and planarized includes (1) a solvent, (2) an ionic species of the conductive material to be deposited, (3) at least one additive to improve electrical and structural properties, and (4) a modifying agent.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A process of depositing and simultaneously polishing and planarizing a high quality conductive layer on a surface of a substrate, comprising:
loading a substrate on a holder; applying electrical power to the surface of the said substrate; introducing a plating solution comprising an oxidizer on an abrasive polishing pad; pressing the abrasive polishing pad against the surface of said substrate; contacting the plating solution with the surface of the substrate and a second electrode; applying a potential difference between the surface of the substrate and the second electrode; depositing a conductive layer on the surface of the substrate; and moving the abrasive pad and the surface of the substrate with respect to each other, thereby simultaneously polishing and planarizing the conductive layer on said substrate.
2 . A process according to claim 1 , wherein the conductive layer comprises copper.
3 . A process according to claim 1 , wherein the plating solution comprises an acidic copper plating solution.
4 . A process according to claim 3 , wherein the acidic copper plating solution has a pH value of less than 4.
5 . A process according to claim 1 , wherein said oxidizer is selected from the group consisting of an inorganic oxidizer, an organic oxidizer, and mixtures thereof.
6 . A process according to claim 5 , wherein the oxidizer is an organic nitrite.
7 . A process according to claim 6 , wherein the nitrite is selected from the group consisting of alkyl nitrites, aromatic nitrites, and polyaromatic nitrites.
8 . A process according to claim 7 , wherein the organic nitrite is an alkyl nitrite.
9 . A process according to claim 8 , wherein the alkyl nitrite is butyl nitrite.
10 . A process according to claim 1 , wherein the oxidizer is an organic nitrate.
11 . A process according to claim 1 , wherein the substrate comprises surface features having a width of about 10-100 microns.
12 . A modified plating solution for simultaneous polishing and planarization of a substrate, comprising:
a solvent; an ionic species of a conductive material; and an oxidizer.
13 . A modified plating solution according to claim 12 , wherein said oxidizer is selected from the group consisting of an inorganic oxidizer, an organic oxidizer, and mixtures thereof.
14 . A modified plating solution according to claim 12 , wherein said oxidizer is an organic nitrite selected from the group consisting of alkyl nitrites, aromatic nitrites, and polyaromatic nitrites.
15 . A modified plating solution according to claim 12 , wherein said solution has a pH value of less than 4.
16 . A modified plating solution according to claim 12 , wherein said oxidizer is present in an amount of more than 500 ppm.
17 . A modified plating solution according to claim 12 , wherein said oxidizer is present in an amount of 0.01 to 10 wt. % of said solution.
18 . A modified plating solution according to claim 12 , wherein said conductive metal is Cu.
19 . A modified plating solution according to claim 12 , wherein said conductive metal is selected from the group consisting of W, Au, Ni, Pt, Pd, Ag, Co, Sn, Pb and their alloys.
20 . A modified plating solution according to claim 12 , further comprising at least one additive selected from the group consisting of levelers, brighteners, grain refiners, wetting agents, and stress-reducing agents.Join the waitlist — get patent alerts
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