US2005018181A1PendingUtilityA1

Defect detection system

Priority: Apr 6, 2001Filed: Aug 16, 2004Published: Jan 27, 2005
Est. expiryApr 6, 2021(expired)· nominal 20-yr term from priority
G01N 21/21G01N 21/956G01N 21/9501
52
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Claims

Abstract

Scattered radiation from a sample surface is collected by means of a collector that collects radiation substantially symmetrically about a line normal to the surface. The collected radiation is directed to channels at different azimuthal angles so- that information related to relative azimuthal positions of the collected scattered radiation about the line is preserved. The collected radiation is converted into respective signals representative of radiation scattered at different azimuthal angles about the line. The presence and/or characteristics of anomalies are determined from the signals. Alternatively, the radiation collected by the collector may be filtered by means of a spatial filter having an annular gap of an angle related to the angular separation of expected pattern scattering. Signals obtained from the narrow and wide collection channels may be compared to distinguish between micro-scratches and particles. Forward scattered radiation may be collected from other radiation and compared to distinguish between micro-scratches and particles. Intensity of scattering is measured when the surface is illuminated sequentially by S- and P-polarized radiation and compared to distinguish between micro-scratches and particles. Representative films may be measured using profilometers or scanning probe microscopes to determine their roughness and by the above-described instruments to determine haze in order to build a database. Surface roughness of unknown films may then be determined by measuring haze values and from the database.

Claims

exact text as granted — not AI-modified
1 . A surface inspection method for detecting anomalies on a surface, comprising: 
 causing the surface to be scanned by a beam of radiation;    collecting radiation scattered from the surface by means of a collector that collects the scattered radiation substantially symmetrically about a line normal to the surface;    directing the collected radiation to channels at different azimuthal angles about the line or about a direction corresponding thereto so that information related to relative azimuthal positions of the collected radiation about the line is preserved and radiation scattered by the surface at different azimuthal angles with respect to the line is conveyed along different channels, said directing including separating the channels from each other by separators to reduce crosstalk;    converting the collected radiation carried by at least some of the channels into respective signals representative of radiation scattered at different azimuthal angles about the line; and    determining the presence and/or characteristics of anomalies in or on the surface from said signals.    
   
   
       2 - 62 . (Cancelled)

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