Inventor · disambiguated record
Jeffrey Rzepiela
Also filed as: RZEPIELA JEFFREY · RZEPIELA JEFFREY A · RZEPIELA JEFFREY ALAN
6 granted patents·2 pending applications·291 citations·filing 2001–2007
86Inventor score
Top patents by PatentIndex Score
8 records- 0197US7893703B2Systems and methods for controlling deposition of a charge on a wafer for measurement of one or more electrical properties of the waferKLA TENCOR TECH CORP·Filed 2006·Granted Feb 22, 2011·104 cites·18 claims
- 0296US6538730B2Defect detection systemKLA TENCOR TECH CORP·Filed 2001·Granted Mar 25, 2003·139 cites·65 claims
- 0386US7110238B1Systems and methods for using non-contact voltage sensors and corona discharge gunsKLA TENCOR TECH CORP·Filed 2005·Granted Sep 19, 2006·11 cites·24 claims
- 0485US6862096B2Defect detection systemKLA TENCOR CORP·Filed 2003·Granted Mar 1, 2005·22 cites·5 claims
- 0573US7187186B2Methods and systems for determining one or more properties of a specimenKLA TENCOR TECH CORP·Filed 2005·Granted Mar 6, 2007·6 cites·17 claims
- 0671US6909291B1Systems and methods for using non-contact voltage sensors and corona discharge gunsKLA TENCOR TECH CORP·Filed 2003·Granted Jun 21, 2005·9 cites·14 claims
- 0752US2005018181A1Defect detection systemFiled 2004·Application pending·0 cites
- 0843US2007126458A1Methods and systems for determining one or more properties of a specimenSHI JIANOU·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →