Method of stacking wafers with anisotropic conductive adhesive
Abstract
The present invention includes a method that provides a first wafer; forms a first raised contact from a first plug on the first wafer; provides a second wafer; forms a second raised contact from a second plug on the second wafer; applies an anisotropic conductive adhesive over the first wafer; aligns the second wafer to the first wafer; attaches the second wafer to the anisotropic conductive adhesive to form a continuous and conductive path between the first raised contact and the second raised contact. The present invention also includes a structure that has an anisotropic conductive film, the anisotropic conductive film has a front surface and a rear surface; a first raised contact is located over the front surface, the first raised contact forming part of a first wafer; and a second raised contact located over the rear surface, the second raised contact forming part of a second wafer, where the second raised contact faces the first raised contact.
Claims
exact text as granted — not AI-modified1 . A method comprising:
providing a first wafer; forming a first raised contact from a first plug on said first wafer; providing a second wafer; forming a second raised contact from a second plug on said second wafer; applying an anisotropic conductive adhesive over said first wafer; aligning said second wafer to said first wafer; attaching said second wafer to said anisotropic conductive adhesive to form a continuous and conductive path between said first raised contact and said second raised contact.
2 . The method of claim 1 wherein said anisotropic conductive adhesive is applied as a paste.
3 . The method of claim 1 wherein said anisotropic conductive adhesive is applied as a film.
4 . The method of claim 1 wherein said anisotropic conductive adhesive comprises a binder and a filler.
5 . The method of claim 4 wherein said binder comprises a thermoset.
6 . The method of claim 4 wherein said filler comprises spherical conductive particles.
7 . A method comprising:
providing a first wafer, said first wafer having a first raised contact; forming an anisotropic conductive film over said first wafer, said anisotropic conductive film comprising a binder and a filler; stacking a second wafer over said anisotropic conductive film, said second wafer having a second raised contact, said second raised contact facing said first raised contact; and applying pressure and heat to cure said binder and to trap a portion of said filler between said first raised contact and said second raised contact, said portion becoming a continuous and conductive path.
8 . The method of claim 7 wherein said first wafer and said second wafer are structurally similar.
9 . The method of claim 7 wherein said first wafer and said second wafer are functionally similar.
10 . The method of claim 7 wherein said binder serves as an underfill between said first wafer and said second wafer.
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