Sol-gel process utilizing reduced mixing temperatures

Abstract

A method of manufacturing a xerogel monolith having a pore diameter distribution includes preparing a first solution comprising metal alkoxide and preparing a second solution comprising a catalyst. A third solution is prepared by mixing the first solution and the second solution together. At least one of the first, second, and third solutions is cooled to achieve a mixture temperature for the third solution which is substantially below room temperature, wherein the third solution has a significantly longer gelation time at the mixture temperature as compared to a room temperature gelation time for the third solution. The method further includes allowing the third solution to gel, thereby forming a wet gel monolith. The method further includes forming the xerogel monolith by drying the wet gel monolith.

1 . A method of manufacturing a xerogel monolith having a pore diameter distribution, the method comprising: 
 preparing a first solution comprising metal alkoxide;    preparing a second solution comprising a catalyst;    preparing a third solution by mixing the first solution and the second solution together;    cooling at least one of the first, second, and third solutions to achieve a mixture temperature for the third solution which is substantially below room temperature, wherein the third solution has a significantly longer gelation time at the mixture temperature as compared to a room temperature gelation time for the third solution;    allowing the third solution to gel, thereby forming a wet gel monolith; and    forming the xerogel monolith by drying the wet gel monolith.    
   
   
       2 . The method of  claim 1 , wherein the pore diameter distribution has an average pore diameter between approximately 200 Angstroms and approximately 1500 Angstroms.  
   
   
       3 . The method of  claim 2 , wherein the average pore diameter is between approximately 400 Angstroms and approximately 1500 Angstroms.  
   
   
       4 . The method of  claim 2 , wherein the average pore diameter is between approximately 700 Angstroms and approximately 1500 Angstroms.  
   
   
       5 . The method of  claim 2 , wherein the average pore diameter is between approximately 1000 Angstroms and approximately 1500 Angstroms.  
   
   
       6 . The method of  claim 2 , wherein at least approximately 20% of the pore diameter distribution is within approximately ±10% of the average pore diameter.  
   
   
       7 . The method of  claim 2 , wherein at least approximately 45% of the pore diameter distribution is within approximately ±30% of the average pore diameter.  
   
   
       8 . The method of  claim 1 , wherein the pore diameter distribution has a mode pore diameter between approximately 200 Angstroms and 1500 Angstroms.  
   
   
       9 . The method of  claim 8 , wherein the mode pore diameter is between approximately 400 Angstroms and approximately 1500 Angstroms.  
   
   
       10 . The method of  claim 8 , wherein the mode pore diameter is between approximately 700 Angstroms and approximately 1500 Angstroms.  
   
   
       11 . The method of  claim 8 , wherein the mode pore diameter is between approximately 1000 Angstroms and approximately 1500 Angstroms.  
   
   
       12 . The method of  claim 8 , wherein at least approximately 30% of the pore diameter distribution is within approximately ±10% of the mode pore diameter.  
   
   
       13 . The method of  claim 8 , wherein at least approximately 90% of the pore diameter distribution is within approximately ±30% of the mode pore diameter.  
   
   
       14 . A xerogel monolith formed using the method of  claim 1 .  
   
   
       15 . A xerogel monolith comprising: 
 a distribution of pore diameters having an average pore diameter between approximately 200 Angstroms and approximately 1500 Angstroms.    
   
   
       16 . The xerogel monolith of  claim 15 , wherein the average pore diameter is between approximately 400 Angstroms and approximately 1500 Angstroms.  
   
   
       17 . The xerogel monolith of  claim 15 , wherein the average pore diameter is between approximately 700 Angstroms and approximately 1500 Angstroms.  
   
   
       18 . The xerogel monolith of  claim 15 , wherein the average pore diameter is between approximately 1000 Angstroms and approximately 1500 Angstroms.  
   
   
       19 . The xerogel monolith of  claim 15 , wherein at least approximately 20% of the distribution of pore diameters is within approximately ±10% of the average pore diameter.  
   
   
       20 . The xerogel monolith of  claim 15 , wherein at least approximately 45% of the distribution of pore diameters is within approximately ±30% of the average pore diameter.  
   
   
       21 . A xerogel monolith comprising: 
 a distribution of pore diameters having a mode pore diameter between approximately 200 Angstroms and approximately 1500 Angstroms.    
   
   
       22 . The xerogel monolith of  claim 21 , wherein the mode pore diameter is between approximately 400 Angstroms and approximately 1500 Angstroms.  
   
   
       23 . The xerogel monolith of  claim 21 , wherein the mode pore diameter is between approximately 700 Angstroms and approximately 1500 Angstroms.  
   
   
       24 . The xerogel monolith of  claim 21 , wherein the mode pore diameter is between approximately 1000 Angstroms and approximately 1500 Angstroms.  
   
   
       25 . The xerogel monolith of  claim 21 , wherein at least approximately 30% of the distribution of pore diameters is within approximately ±10% of the mode pore diameter.  
   
   
       26 . The xerogel monolith of  claim 21 , wherein at least approximately 90% of the distribution of pore diameters is within approximately ±30% of the average pore diameter.