US2006102198A1PendingUtilityA1
Rotational thermophoretic drying
Est. expiryApr 3, 2023(expired)· nominal 20-yr term from priority
Inventors:Steven Verhaverbeke
H10P 72/0408H10P 72/0406H10P 72/0414
47
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Claims
Abstract
A method that includes rotating a wafer, heating the wafer, applying a first liquid through one or more nozzles to a center of a topside of the wafer that is cooler than the heated wafer, and translating the one or more nozzles to an outer diameter edge of the wafer.
Claims
exact text as granted — not AI-modified1 - 18 . (canceled)
19 . An apparatus for drying a wafer comprising:
a wafer holding chuck, said chuck being capable of rotation; a means of heating a wafer on said chuck; a means of providing a cooled fluid; a means of dispensing the cooled fluid onto the heated wafer, wherein said means of dispensing comprises one or more nozzles; a means of creating a moving thermal gradient across the wafer, comprising:
translating one or more nozzles across the wafer to the outer edge of the wafer, as the cooled fluid is dispensed onto the heated wafer.
20 . The apparatus of claim 19 , wherein said means of heating comprises a means of applying a heated fluid to the back side of the wafer on the chuck by means of a through hole in a platter.
21 . The apparatus of claim 20 , wherein said platter and said chuck are positioned a distance from each other, thereby creating a gap between the platter and the chuck through which the heated fluid can flow.
22 . The apparatus of claim 19 , wherein one nozzle does not translate, while at least one nozzle translates.Join the waitlist — get patent alerts
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