US2006157872A1PendingUtilityA1
Epoxy resin composition and semiconductor device
Est. expiryNov 30, 2024(expired)· nominal 20-yr term from priority
H10W 74/47H10W 74/01H10W 74/10H10W 74/473C08K 3/013C08L 63/00C08C 19/06C08L 15/00C08L 61/06C08L 13/00C09D 163/08C09D 163/00C08L 9/02
42
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Claims
Abstract
An epoxy resin composition for encapsulating a semiconductor chip containing (A) a crystalline epoxy resin, (B) a phenol resin represented by general formula (1): wherein R1 and R2 are independently hydrogen or alkyl having 1 to 4 carbon atoms and two or more R1s or two or more R2s are the same or different; a is integer of 0 to 4; b is integer of 0 to 4; c is integer of 0 to 3; and n is average and is number of 0 to 10, (C) a (co)polymer containing butadiene-derived structural unit or its derivative, and (D) an inorganic filler in the amount of 80 wt % to 95 wt % both inclusive in the total epoxy resin composition.
Claims
exact text as granted — not AI-modified1 . An epoxy resin composition for encapsulating a semiconductor chip comprising
(A) a crystalline epoxy resin, (B) a phenol resin represented by general formula (1): wherein R1 and R2 are independently hydrogen or alkyl having 1 to 4 carbon atoms and two or more R1s or two or more R2s are the same or different; a is integer of 0 to 4; b is integer of 0 to 4; c is integer of 0 to 3; and n is average and is number of 0 to 10, (C) a (co)polymer containing butadiene-derived structural unit or its derivative, and (D) an inorganic filler in the amount of 80 wt % to 95 wt % both inclusive in the total epoxy resin composition.
2 . The epoxy resin composition for encapsulating a semiconductor chip as claimed in claim 1 , wherein said phenol resin (B) is represented by general formula (2):
wherein R1 and R2 are independently hydrogen or alkyl having 1 to 4 carbon atoms and two or more R1s or two or more R2s are the same or different; a is integer of 0 to 4; b is integer of 0 to 4; c is integer of 0 to 3; and n is average and is number of 0 to 10;
said (co)polymer or its derivative (C) is an epoxidized polybutadiene compound (C-1); and
said inorganic filler (D) is contained in the amount of 85 wt % to 95 wt % both inclusive in the total epoxy resin composition.
3 . The epoxy resin composition for encapsulating a semiconductor chip as claimed in claim 2 , wherein the number average molecular weight of said epoxidized polybutadiene compound (C-1) is 500 to 4000 both inclusive.
4 . The epoxy resin composition for encapsulating a semiconductor chip as claimed in claim 2 , further comprising a curing accelerator (E).
5 . A semiconductor device wherein a semiconductor chip is encapsulated with the epoxy resin composition for encapsulating a semiconductor chip as claimed in claim 2 .
6 . The epoxy resin composition for encapsulating a semiconductor chip as claimed in claim 2 used for encapsulating an area mounting type semiconductor device,
wherein a semiconductor chip is mounted on one side of the substrate and substantially only the side of the substrate mounting the semiconductor chip is encapsulated.
7 . An area mounting type semiconductor device, wherein a semiconductor chip is encapsulated with the area mounting type epoxy resin composition for encapsulating a semiconductor chip as claimed in claim 6 .
8 . The epoxy resin composition for encapsulating a semiconductor chip as claimed in claim 1 ,
wherein said phenol resin (B) is represented by general formula (2): wherein R1 and R2 are independently hydrogen or alkyl having 1 to 4 carbon atoms and two or more R1s or two or more R2s are the same or different; a is integer of 0 to 4; b is integer of 0 to 4; c is integer of 0 to 3; and n is average and is number of 0 to 10, wherein said (co)polymer or its derivative (C) is a butadiene-acrylonitrile copolymer (C-2).
9 . The epoxy resin composition for encapsulating a semiconductor chip as claimed in claim 8 , wherein said butadiene-acrylonitrile copolymer (C-2) is a carboxyl-terminated butadiene-acrylonitrile copolymer represented by general formula (3):
wherein Bu represents a butadiene-derived structural unit; ACN represents an acrylonitrile-derived structural unit; x is positive number of less than 1; y is positive number of less than 1; x+y=1; and z is integer of 50 to 80.
10 . The epoxy resin composition for encapsulating a semiconductor chip as claimed in claim 8 , wherein said butadiene-acrylonitrile copolymer (C-2) is contained in the amount of 0.05 wt % to 0.5 wt % both inclusive in the total epoxy resin composition.
11 . The epoxy resin composition for encapsulating a semiconductor chip as claimed in claim 8 , wherein said inorganic filler (D) is contained in the amount of 85 wt % to 95 wt % both inclusive in the total epoxy resin composition.
12 . The epoxy resin composition for encapsulating a semiconductor chip as claimed in claim 8 , further comprising a curing accelerator (E).
13 . A semiconductor device wherein a semiconductor chip is encapsulated with the epoxy resin composition for encapsulating a semiconductor chip as claimed in claim 8 .
14 . The epoxy resin composition for encapsulating a semiconductor chip as claimed in claim 8 used for encapsulating an area mounting type semiconductor device,
wherein a semiconductor chip is mounted on one side of the substrate and substantially only the side of the substrate mounting the semiconductor chip is encapsulated.
15 . An area mounting type semiconductor device, wherein a semiconductor chip is encapsulated with the area mounting type epoxy resin composition for encapsulating a semiconductor chip as claimed in claim 14 .
16 . The epoxy resin composition for encapsulating a semiconductor chip as claimed in claim 1 ,
wherein said crystalline epoxy resin (A) is represented by general formula (4): wherein X is group selected from single bond, —O—, —S— and —C(R2) 2 —; R1 is alkyl having 1 to 6 carbon atoms; two or more R1s are the same or different; m is integer of 0 to 4; R2 is hydrogen or alkyl having 1 to 4 carbon atoms; and two or more R2s is the same or different, said phenol resin (B) is represented by general formula (5): wherein R1 and R2 are independently hydrogen or alkyl having 1 to 4 carbon atoms; two or more R1s or two or more R2s are the same or different; a is integer of 0 to 3; b is integer of 0 to 4; n is average and is positive number of 1 to 5, said (co)polymer or its derivative (C) is a polybutadiene having the intramolecular oxirane structure (C-3) with the oxirane-oxygen content of 3% to 10% both inclusive, and said inorganic filler (D) is contained in the amount of 85 wt % to 95 wt % both inclusive in the total epoxy resin composition; and further comprising (F) an epoxy resin represented by general formula (6): wherein R1 and R2 are independently hydrogen or alkyl having 1 to 4 carbon atoms; two or more R1s or two or more R2s are the same or different; a is integer of 0 to 3, b is integer of 0 to 4; and n is average and is positive number of 1 to 5.
17 . The epoxy resin composition for encapsulating a semiconductor chip as claimed in claim 16 , wherein said polybutadiene having the intramolecular oxirane structure (C-3) has a viscosity of 20 Pa·s to 700 Pa·s both inclusive at 25° C.
18 . The epoxy resin composition for encapsulating a semiconductor chip as claimed in claim 16 , further comprising a curing accelerator (E).
19 . A semiconductor device wherein a semiconductor chip is encapsulated with the epoxy resin composition for encapsulating a semiconductor chip as claimed in claim 16 .
20 . The epoxy resin composition for encapsulating a semiconductor chip as claimed in claim 16 used for encapsulating an area mounting type semiconductor device,
wherein a semiconductor chip is mounted on one side of the substrate and substantially only the side of the substrate mounting the semiconductor chip is encapsulated.
21 . An area mounting type semiconductor device, wherein a semiconductor chip is encapsulated with the area mounting type epoxy resin composition for encapsulating a semiconductor chip as claimed in claim 20 .
22 . The epoxy resin composition for encapsulating a semiconductor chip as claimed in claim 1 ,
wherein said crystalline epoxy resin (A) is represented by general formula (4): wherein X is group selected from single bond, —O—, —S— and —C(R2) 2 —; R1 is alkyl having 1 to 6 carbon atoms; two or more R1s are the same or different; m is integer of 0 to 4; R2 is hydrogen or alkyl having 1 to 4 carbon atoms; and two or more R2s is the same or different, said phenol resin (B) is represented by general formula (5): wherein R1 and R2 are independently hydrogen or alkyl having 1 to 4 carbon atoms; two or more R1s or two or more R2s are the same or different; a is integer of 0 to 3; b is integer of 0 to 4; n is average and is positive number of 1 to 5, and said (co)polymer or its derivative (C) is an epoxidized polybutadiene compound (C-1), said inorganic filler (D) is contained in the amount of 80 wt % to 94 wt % both inclusive in the total epoxy resin composition; further comprising (F) an epoxy resin represented by general formula (6): wherein R1 and R2 are independently hydrogen or alkyl having 1 to 4 carbon atoms; two or more R1s or two or more R2s are the same or different; a is integer of 0 to 3, b is integer of 0 to 4; and n is average and is positive number of 1 to 5; and wherein the weight ratio [(F)/(A)] of said epoxy resin (F) to said crystalline epoxy resin (A) represented by general formula (4) is 10/90 to 90/10 both inclusive.
23 . The epoxy resin composition for encapsulating a semiconductor chip as claimed in 22, wherein said epoxidized polybutadiene compound (C-1) has the number average molecular weight of 500 to 4000 both inclusive.
24 . The epoxy resin composition for encapsulating a semiconductor chip as claimed in claim 22 , further comprising a curing accelerator (E).
25 . A semiconductor device wherein a semiconductor chip is encapsulated with the epoxy resin composition for encapsulating a semiconductor chip as claimed in claim 22 .
26 . The epoxy resin composition for encapsulating a semiconductor chip as claimed in claim 22 used for encapsulating an area mounting type semiconductor device,
wherein a semiconductor chip is mounted on one side of the substrate and substantially only the side of the substrate mounting the semiconductor chip is encapsulated.
27 . An area mounting type semiconductor device, wherein a semiconductor chip is encapsulated with the area mounting type epoxy resin composition for encapsulating a semiconductor chip as claimed in claim 26 .
28 . The epoxy resin composition for encapsulating a semiconductor chip as claimed in claim 1 ,
wherein said crystalline epoxy resin (A) is represented by general formula (4): wherein X is group selected from single bond, —O—, —S— and —C(R2) 2 —; R1 is alkyl having 1 to 6 carbon atoms; two or more R1s are the same or different; m is integer of 0 to 4; R2 is hydrogen or alkyl having 1 to 4 carbon atoms; and two or more R2s is the same or different, said phenol resin (B) is represented by general formula (5): wherein R1 and R2 are independently hydrogen or alkyl having 1 to 4 carbon atoms; two or more R1s or two or more R2s are the same or different; a is integer of 0 to 3; b is integer of 0 to 4; n is average and is positive number of 1 to 5, and said (co)polymer or its derivative (C) is a butadiene-acrylonitrile copolymer (C-2); and further comprising (F) an epoxy resin represented by general formula (6): wherein R1 and R2 are independently hydrogen or alkyl having 1 to 4 carbon atoms; two or more R1s or two or more R2s are the same or different; a is integer of 0 to 3, b is integer of 0 to 4; and n is average and is positive number of 1 to 5.
29 . The epoxy resin composition for encapsulating a semiconductor chip as claimed in claim 28 ,
wherein said butadiene-acrylonitrile copolymer (C-2) is a carboxyl-terminated butadiene-acrylonitrile copolymer represented by general formula (3): wherein Bu represents a butadiene-derived structural unit; ACN represents an acrylonitrile-derived structural unit; x is positive number of less than 1; y is positive number of less than 1; x+y=1; and z is integer of 50 to 80.
30 . The epoxy resin composition for encapsulating a semiconductor chip as claimed in claim 28 ,
wherein said butadiene-acrylonitrile copolymer (C-2) is contained in the amount of 0.05 wt % to 0.5 wt % both inclusive in the total epoxy resin composition.
31 . The epoxy resin composition for encapsulating a semiconductor chip as claimed in claim 28 , wherein the weight ratio [(F)/(A)] of the epoxy resin (F) to the crystalline epoxy resin (A) represented by general formula (4) is 10/90 to 90/10 both inclusive.
32 . The epoxy resin composition for encapsulating a semiconductor chip as claimed in claim 28 , further comprising a curing accelerator (E).
33 . A semiconductor device wherein a semiconductor chip is encapsulated with the epoxy resin composition for encapsulating a semiconductor chip as claimed in claim 28 .
34 . The epoxy resin composition for encapsulating a semiconductor chip as claimed in claim 28 used for encapsulating an area mounting type semiconductor device,
wherein a semiconductor chip is mounted on one side of the substrate and substantially only the side of the substrate mounting the semiconductor chip is encapsulated.
35 . An area mounting type semiconductor device, wherein a semiconductor chip is encapsulated with the area mounting type epoxy resin composition for encapsulating a semiconductor chip as claimed in claim 34.Cited by (0)
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