Method and system for detecting potential reliability failures of integrated circuit

Abstract

A method and system for detecting a potential reliability problem cause by electrical bridging in an integrated circuit. A voltage difference is created between two conducting lines in the integrated circuit to accelerate the bridging effect for a predetermined period of time. The conducting lines are detected to determine whether an undesired connection has occurred due to the bridging effect between the conducting lines.

1 . A method for detecting a potential bridging effect between a first conducting line and a second conducting line in an integrated circuit, the method comprising: 
 creating a voltage difference between the first conducting line and the second conducting line for a predetermined period of time for inducing the bridging effect therebetween; and    detecting whether an undesired connection has occurred due to the bridging effect between the first conducting line and the second conducting line.    
   
   
       2 . The method of  claim 1  wherein the first conducting line is adjacent to the second conducting line.  
   
   
       3 . The method of  claim 1  wherein the first conducting line and the second conducting line are made of metal or silicon-based materials.  
   
   
       4 . The method of  claim 1  wherein the creating a voltage difference further comprises: 
 applying a first voltage to the first conducting line; and    applying a second voltage to the second conducting line wherein the first voltage is higher than the second voltage.    
   
   
       5 . The method of  claim 1  wherein: 
 the first conducting line is adjacent to the second conducting line;    the first conducting line and the second conducting line are made of metal or silicon-based materials; and    the step of creating a voltage difference further comprises:    applying a first voltage to the first conducting line; and    applying a second voltage to the second conducting line wherein the first voltage is higher than the second voltage.    
   
   
       6 . A system for detecting a potential bridging effect between a first conducting line and a second conducting line in an integrated circuit, the system comprising: 
 means for creating a voltage difference between the first conducting line and the second conducting line for a predetermined period of time for inducing the bridging effect therebetween; and    means for detecting whether a connection has occurred due to the bridging effect between the first conducting line and the second conducting line.    
   
   
       7 . The system of  claim 6  wherein the first conducting line is adjacent to the second conducting line.  
   
   
       8 . The system of  claim 7  wherein the integrated circuit is a memory chip.  
   
   
       9 . The system of  claim 8  wherein the means for creating a voltage difference further comprises a selection circuit for selectively raising the first conducting line or the second conducting line to a high voltage level.  
   
   
       10 . The system of  claim 9  wherein the selection circuit selects the first conducting line or the second conducting line in response to inputs designating an address of a memory cell and an activation of a data erasure.  
   
   
       11 . The system of  claim 10  wherein the selection circuit is further responsive to an input designating the predetermined period of time.  
   
   
       12 . The system of  claim 6  wherein the integrated circuit is a memory chip.  
   
   
       13 . The system of  claim 6  wherein the means for creating a voltage difference further comprises a selection circuit for selectively raising the first conducting line or the second conducting line to a high voltage level.  
   
   
       14 . The system of  claim 13  wherein the selection circuit selects the first conducting line or the second conducting line in response to inputs designating an address of a memory cell and an activation of a data erasure.  
   
   
       15 . The system of  claim 13  wherein the selection circuit is further responsive to an input designating the predetermined period of time.