US2006192281A1PendingUtilityA1

Methods for sealing chambers of microelectronic packages

46
Assignee: LU DAOQIANGPriority: Sep 30, 2004Filed: Apr 19, 2006Published: Aug 31, 2006
Est. expirySep 30, 2024(expired)· nominal 20-yr term from priority
H10W 72/5522H10W 72/536Y10S257/924B81C 1/00269
46
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Claims

Abstract

Microelectronic packages having chambers and sealing materials, and methods of making the packages, and sealing the chambers, are disclosed. An exemplary package may include a first surface, a second surface, a solid sealing material including an intermetallic compound, such as, for example, of gallium or another relatively low melting material, between the first surface and the second surface, and a chamber defined by the first surface, the second surface, and the sealing material. An exemplary method may include disposing a ring of a sealing material including a liquid metal between a first surface and a second surface to define a chamber between the first surface, the second surface, and the ring of the sealing material, and sealing the chamber by heating the sealing material to react the liquid metal with a metal that is capable of forming an intermetallic compound with the liquid metal.

Claims

exact text as granted — not AI-modified
1 - 23 . (canceled)  
   
   
       24 . A method comprising: 
 disposing a ring of a sealing material including a liquid metal between a first surface and a second surface to define a chamber between the first surface, the second surface, and the ring of the sealing material;    sealing the chamber by heating the sealing material to react the liquid metal with a metal that is capable of forming one or more intermetallic compounds with the liquid metal.    
   
   
       25 . The method of  claim 24 , wherein said disposing comprises disposing a liquid metal having a melting point temperature that is less than 250° C.  
   
   
       26 . The method of  claim 25 , wherein said disposing comprises disposing a liquid metal having a melting point temperature that is less than 100° C.  
   
   
       27 . The method of  claim 26 , wherein said disposing comprises disposing a liquid metal including gallium.  
   
   
       28 . The method of  claim 27 , wherein said disposing the liquid metal including the gallium includes disposing a liquid metal lacking a solid metal.  
   
   
       29 . The method of  claim 24 , wherein said sealing comprises sealing one or more microelectromechanical systems in the chamber.  
   
   
       30 . The method of  claim 24 , wherein said disposing comprises printing or dispensing the sealing material.  
   
   
       31 . A method comprising: 
 applying a sealing material including a liquid metal having a melting point that is less than 250° C. over a first surface; placing a second surface relative to the first surface to define a chamber between the first surface, the second surface, and the sealing material;    reacting the liquid metal with one or more metals to form a compound having a substantially fixed stoichiometric ratio and a melting point that is greater than 250° C.    
   
   
       32 . The method of  claim 31 , wherein said applying the sealing material comprises dispensing or printing the liquid metal, and wherein the melting point is less than 100° C.  
   
   
       33 . The method of  claim 31 , wherein said applying the sealing material comprises introducing one or more of gallium, cesium, and indium over the first surface.  
   
   
       34 . The method of  claim 31 , wherein one or more of the first surface and the second surface include the one or more metals.  
   
   
       35 . The method of  claim 31 , further comprising sealing one or more microelectromechanical systems in the chamber.  
   
   
       36 . The method of  claim 31 , wherein said applying the sealing material comprises applying a paste including particles of the one or more metals.  
   
   
       37 . A method comprising: 
 dispensing or printing a ring of material including a liquid metal having a melting point that is less than 250° C. over one or more of a surface of a die having one or more microelectromechanical systems and a surface of a cap;    placing the cap over the die to define a chamber between the cap, the die, and the sealing material;    sealing the chamber by reacting the liquid metal with one or more other metals to form a compound having a melting point temperature that is greater than 250° C.    
   
   
       38 . The method of  claim 37 , wherein said dispensing or printing comprises dispensing or printing a paste having particles of the one or more other metals therein.  
   
   
       39 . The method of  claim 37 , wherein said sealing the chamber comprises forming one or more intermetallic compounds.  
   
   
       40 . The method of  claim 37 , wherein the melting point of the liquid metal is less than 100° C.  
   
   
       41 . The method of  claim 37 , wherein the liquid metal comprises one or more metals selected from gallium, cesium, and indium.  
   
   
       42 . The method of  claim 41 , wherein the liquid metal comprises gallium.

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